APPARATUS AND METHODS FOR SPATIALLY AND TEMPORALLY SORTING IONS USING RF TRAVELLING WAVES

    公开(公告)号:EP4513528A1

    公开(公告)日:2025-02-26

    申请号:EP24194884.3

    申请日:2024-08-16

    Abstract: A method of operating an ion optical component comprising a series of electrodes between first and second ends comprises: applying a set of RF voltage waveforms to electrodes of the series that generate a plurality of moving pseudopotential wells that exert forces on ions within the ion optic that urge the ions to migrate from the first end to the second end of the ion optic; and applying, simultaneously with the application of the set of RF voltage waveforms, a set of DC electrical potentials to electrodes of the series that generate a DC field that exerts a force on the ions within the ion optic that urges the ions to migrate from the second end to the first end, whereby there is caused one or more of spatial separation, differential migration or filtering of ions within the ion optical component in accordance with their respective mass-to-charge ( m / z ) ratios.

    COLLISION JUDGMENT APPARATUS, RECORDING MEDIUM RECORDING PROGRAM, AND COLLISION JUDGMENT METHOD

    公开(公告)号:EP4404235A3

    公开(公告)日:2025-01-29

    申请号:EP23216424.4

    申请日:2023-12-13

    Applicant: JEOL Ltd.

    Abstract: Based on a three-dimensional model of a dynamic object having a position which changes, point group information which represents, with a group of points, a three-dimensional shape of the dynamic object is generated. Based on a three-dimensional model of a static object having a position which does not change, point group information representing, with a group of points, a three-dimensional shape of the static object is generated. Based on the point group information of the static object, voxel group information which represents, with a group of voxels, the three-dimensional shape of the static object, and which is formed into a database is generated. Presence or absence of overlap between the dynamic object and the static object is judged by collating voxel group information representing the static object which is present on a movement path of the dynamic object, and point group information representing the dynamic object.

    METHOD FOR QUANTITATIVELY ANALYZING ELEMENTS

    公开(公告)号:EP4495591A1

    公开(公告)日:2025-01-22

    申请号:EP22947837.5

    申请日:2022-06-20

    Applicant: IAS Inc.

    Abstract: The present invention provides a method for a quantitative analysis of elements in a sample gas, such as an LA-ICP-MS, without use of a solid reference sample. The present invention includes, in a method for a quantitative analysis of elements in a solid sample with an inductively coupled plasma mass spectrometer to which a sample gas generated from the solid sample is introduced, measuring concentrations of elements contained in the sample gas by use of signal intensities obtained by introducing a standard solution containing specific elements in known concentrations from a solution introduction unit to a torch part in such a manner as to directly supply (standard addition) the standard solution at a flow rate of 3 µL/min or less.

    AUTOMATIC POSITIONING OF AN ELECTROSPRAY IONIZATION EMITTER

    公开(公告)号:EP4471826A2

    公开(公告)日:2024-12-04

    申请号:EP24179627.5

    申请日:2024-06-03

    Abstract: A position control system may acquire a set of mass spectra by directing an automated positioning system to sequentially position an ionization emitter at a plurality of positions relative to an inlet of a mass spectrometer and directing the mass spectrometer to acquire, while the ionization emitter is positioned at each position of the plurality of positions, a mass spectrum of ions introduced into the inlet. The ions introduced into the inlet include ions emitted from the ionization emitter. The position control system may generate, based on the set of mass spectra, an ion intensity map representing intensity of ions introduced into the inlet of the mass spectrometer as a function of position of the ionization emitter. Based on the ion intensity map, the position control system may identify an optimum position for the ionization emitter.

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