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    METHODS AND SYSTEMS FOR SENSING DEFORMATION
    1.
    发明公开
    METHODS AND SYSTEMS FOR SENSING DEFORMATION 审中-实审

    公开(公告)号：EP4428484A1

    公开(公告)日：2024-09-11

    申请号：EP24156153.9

    申请日：2024-02-06

    申请人： Honeywell International Inc.

    发明人： YANG, Fan ,  WANG, Jun ,  HU, Yu ,  WANG, Houyong ,  CHEN, Wu

    IPC分类号： G01B5/30 ,  G01B7/16

    CPC分类号： G01B7/16 ,  G01B5/30

    摘要： Methods, apparatuses and systems for a sensing deformation in a surface are disclosed herein. An example device may include a support unit including a first frame and a second frame. A first end of the first frame and a first end of the second frame are mechanically coupled to the surface. The sensing device includes a pin joint that mechanically couples the first frame to the second frame, such that a first relative movement between the first end of the first frame and the first end of the second frame is amplified to a second relative movement between a second end of the first frame and a second end of the second frame. The sensing device includes a sensor that senses the second relative movement between the second end of the first frame and the second end of the second frame.