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11.发明专利
公开(公告)号：JP2006047076A
公开(公告)日：2006-02-16
申请号：JP2004227603
申请日：2004-08-04
发明人： TSUBOI NOBUHIRO
IPC分类号： G01R13/28
摘要： PROBLEM TO BE SOLVED: To inspect whether or not an input data pattern fulfills time periodicity in a logic analyzer without giving an expected value data pattern.
SOLUTION: A time periodic part is recognized with a periodicity recognition circuit 112 in the initial stage of input data of a logic analyzer, the recognition result is stored with a periodicity storage circuit 113 and whether or not the input data after that indicates repetition of the data of the stored periodic part is inspected with a periodicity inspection circuit 114.
COPYRIGHT: (C)2006,JPO&NCIPI摘要翻译： 要解决的问题：检查输入数据模式是否在不给出期望值数据模式的情况下满足逻辑分析仪的时间周期。 解决方案：在逻辑分析仪的输入数据的初始阶段，周期性识别电路112识别时间周期部分，识别结果与周期性存储电路113一起存储，之后的输入数据是否表示 使用周期性检查电路114检查所存储的周期性部分的数据的重复。版权所有：（C）2006，JPO＆NCIPI
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14.发明专利System and method for correcting interchannel skew of a plurality of sampling digitizers 有权校正多个采样数字信号的通道间距的系统和方法
公开(公告)号：JP2004239754A
公开(公告)日：2004-08-26
申请号：JP2003029329
申请日：2003-02-06
申请人： Advantest Corp , 株式会社アドバンテスト
发明人： NAKAJIMA TAKAHIRO
IPC分类号： G01R35/00 , G01R13/28 , G01R31/28 , G01R31/316 , G01R31/3183 , G01R31/319
摘要： PROBLEM TO BE SOLVED: To provide an interchannel skew correction system for a plurality of sampling digitizers capable of correcting at any time an interchannel skew between the plurality of the sampling digitizers in a state of being assembled into a system.
SOLUTION: The interchannel skew correction system for the plurality of the sampling digitizers, is provided with an M-distributed clock supply means for clocks of the same timing, and a skew measurement means. The M-distributed clock supply means individually separates A plurality of M signals to be measured output from a DUT on a performance board for putting the DUT on and performs interruptions, and supplies calibrating clocks of the same timing condition to a plurality M of sampling head sections. The skew measuring means specifies an interchannel skew ΔT on the basis of groups of measured data acquired by supplying the calibrating clocks to the plurality M of the sampling head sections, and performing sampling measurement at each sampling head section.
COPYRIGHT: (C)2004,JPO&NCIPI摘要翻译： 要解决的问题：提供一种用于多个采样数字化仪的通道间偏斜校正系统，其能够在任何时候在组装成系统的状态下校正多个采样数字化仪之间的通道间偏斜。 解决方案：用于多个采样数字转换器的通道间偏斜校正系统具有用于相同定时的时钟的M分布时钟提供装置和偏斜测量装置。 M分布式时钟供给装置分别将待测DUT输出的多个M信号分离到用于放置DUT的性能板上并执行中断，并将相同定时条件的校准时钟提供给多个采样头M 部分。 偏斜测量装置基于通过将校准时钟提供给采样头部分的多个M而获得的测量数据组，并且在每个采样头部分执行采样测量来指定信道间扭曲ΔT。 版权所有（C）2004，JPO＆NCIPI
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公开(公告)号：JP2004028591A
公开(公告)日：2004-01-29
申请号：JP2002180754
申请日：2002-06-21
申请人： Shibasoku:Kk , 株式会社シバソク
发明人： IWATA HIROKI , TATEISHI TAKAYUKI
IPC分类号： G01R13/28 , G01R31/28 , G01R31/3183
摘要： PROBLEM TO BE SOLVED: To shorten, remarkably compared with hitherto, a time required for display of a response signal by applying to emulation of an integrated circuit by a logic circuit, concerning a testing device.
SOLUTION: In this device, signal waveforms of a test signal and the response signal are generated and displayed by test signal generation data serving to test signal generation and determination data which is a determination standard for the response signal.
COPYRIGHT: (C)2004,JPO-
公开(公告)号：JP2003227850A
公开(公告)日：2003-08-15
申请号：JP2002359917
申请日：2002-12-11
申请人： TEKTRONIX INC
发明人： REED GARY W , LYFORD J STEVE , LARSON LESTER L , MARK WILLIAM R
摘要： PROBLEM TO BE SOLVED: To provide a multi-channel probe head with low input capacitance not requiring a standing connector on a device to be rested and connectable with the device to be tested. SOLUTION: A plurality of input signal pads 58 exposes at one end of a substrate 56. A housing 50 has an open end 52 for receiving the substrate and a substrate support member 54, and the input signal pads exposes to the open end. A detachable signal contact holder 60 is attached to the open end of the housing and supports conductive elastomer signal contacts 62 so as to connect with the input signal pads. COPYRIGHT: (C)2003,JPO
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公开(公告)号：JP2000338139A
公开(公告)日：2000-12-08
申请号：JP14515899
申请日：1999-05-25
申请人： HIOKI ELECTRIC WORKS
摘要： PROBLEM TO BE SOLVED: To provide a waveform display device allowing an easy comparison among arbitrary and multiple waveform parts of an input signal. SOLUTION: This device is provided with a waveform memory storing signal waveform data converted from an input signal, and a display part 3 displaying a signal waveform W1 of the input signal, and is constituted such that a display screen of the display part 3 is divided to display multiple divided display screens 12, 13, and signal waveforms W1, W1 are displayed in the individual divided display screens 12, 13. This device is constituted such that signal waveform data respectively corresponding to arbitrary and multiple waveform parts of the input signal are read from the waveform memory, and the multiple waveform parts are respectively displayed in the multiple divided display screen 12, 13.
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