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公开(公告)号:JP3663056B2
公开(公告)日:2005-06-22
申请号:JP20755698
申请日:1998-07-23
Applicant: 株式会社日立サイエンスシステムズ , 株式会社日立製作所
IPC: G01N23/225 , G01N1/28 , H01J37/20
CPC classification number: H01J37/20 , H01J2237/2001
Abstract: High resolution observation of a sample at a high temperature above 1000° C. is accomplished by suppressing sample drift by heating over a short time and with small electric current. A heater envelope made of a ceramic having a carbon coating on the surface is attached around a heater surrounding the sample. The heater envelope is rotatable around pivot screws, and has an outer frame portion of a holder individually having slots capable of letting an FIB enter so that the sample mounting on the holder, as it is, may be milled with the FIB.
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