利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

21 条记录 (耗时 0.014 秒)

    Measuring apparatus, measuring method, and parameter setting method
    8.
    发明专利
    Measuring apparatus, measuring method, and parameter setting method 有权
    测量装置，测量方法和参数设置方法

    公开(公告)号：JP2013104728A

    公开(公告)日：2013-05-30

    申请号：JP2011247571

    申请日：2011-11-11

    申请人： Sony Corp ,  ソニー株式会社

    发明人： CHOKAI YOICHI ,  KAWABE HIDEO ,  KABASAWA KENICHI ,  SUZUKI TATSUYA ,  IMAI HIROKAZU ,  UENO MASATOSHI

    IPC分类号： G01N21/27 ,  A61B5/00 ,  A61B5/1455 ,  G01N21/47

    CPC分类号： A61B5/0075 ,  A61B5/0079 ,  G01N21/474 ,  G01N2021/4761

    摘要： PROBLEM TO BE SOLVED: To provide a measuring apparatus having further reduced size, a measuring method, and a parameter setting method.SOLUTION: This measuring apparatus is provided with: a light receiving element, which is provided at a position facing a region to be measured, the region having disposed therein a subject to be measured, and which makes light form an image, the light having been transmitted from the region to be measured; a plurality of light emitting elements, which are disposed at the periphery of the light receiving element, and output light for measuring the subject to be measured; and a reflective optical element, which is provided above the light emitting elements, and guides, to the region to be measured, the light emitted from the light emitting elements. The light receiving surface of the light receiving element, and the light output surfaces of the light emitting elements are positioned on a same plane, the light emitted from the light emitting elements is reflected by the reflective optical element, and the center lines of the light emitted from respective light emitting elements pass through substantially the center of the region to be measured.

    摘要翻译： 要解决的问题：提供具有进一步减小尺寸的测量装置，测量方法和参数设置方法。 解决方案：该测量装置设置有：受光元件，其设置在面向待测区域的位置，该区域设置在被测物体内，并使光形成图像， 从被测区域发射的光; 设置在光接收元件的周围的多个发光元件和用于测量待测对象的输出光; 以及设置在发光元件上方的反射光学元件，并且将从发光元件发射的光引导到被测量区域。 光接收元件的光接收表面和发光元件的光输出表面位于同一平面上，从发光元件发射的光被反射光学元件反射，并且光的中心线 从各个发光元件发射的基本上通过待测区域的中心。 版权所有（C）2013，JPO＆INPIT