摘要:
A bidirectional amplifier circuit includes first and second input ports, first and second output ports, a power amplifier, and first, second, third, and fourth filter circuits. The power amplifier includes at least first and second input terminals and first and second output terminals. The first filter circuit is coupled between the first input port and the power amplifier first input terminal. The second filter circuit is coupled between the second input port and the power amplifier second input terminal. The third filter circuit is coupled between the first output port and the power amplifier first output terminal. The fourth filter circuit is coupled between the second output port and the power amplifier second output terminal. Carrier waves of differing frequencies may be injected into the amplifier circuit first and second input ports, and transmitted from the first and second output ports. The configuration provides broadband operation with flat gain and high efficiency at the frequencies of each of the carrier waves.
摘要:
An exemplary system and method for providing differential adjustment of the height of a multilayer substrate in localized areas for improved Q-factor performance of RF devices is disclosed as comprising inter alia: a multilayer substrate (200); an RF component (210) embedded in the substrate (200); a surface mounted component (220); and an RF shield (260) disposed next to the surface mounted component (220), wherein the height of the shield (260) does not extend substantially beyond the height of the surface mounted component (220). Disclosed features and specifications may be variously controlled, configured, adapted or otherwise optionally modified to further improve or otherwise optimize Q, RF performance and/or material characteristics. Exemplary embodiments of the present invention representatively provide for high-performance, high-quality RF devices that may be readily incorporated with existing technologies for the improvement of frequency response, device package form factors, weights and/or other manufacturing, device or material performance metrics.