Abstract:
A single event effect immune oscillator circuit is disclosed. The single event upset immune oscillator circuit includes an odd number of logic circuit blocks connecting in series to provide a continuous pulse signal at an output of the oscillator circuit. Each logic circuit block has a first input, a second input, and an output. For a series of logic circuit blocks i, where i=1 to n (n is an odd number), the output of a logic circuit block i is connected to a first input of a logic circuit block i+1. The output of the logic circuit block i is also connected to a first input of a logic circuit block i+x, wherein x is an odd number greater than one and less than or equal to n.
Abstract:
A method and system for predicting manufacturing yield for a proposed integrated circuit The method includes: in the order recited: (a) providing a multiplicity of different integrated circuit library elements in a design database, each library element linked to a corresponding normalization factor in the design database; (b) selecting library elements from the design database to include in a proposed design for the integrated circuit; (c) generating an equivalent circuit count of the proposed design based on the normalization factors and a count of each different library element included in the proposed design; and (d) calculating a predicted manufacturing yield based on the equivalent circuit count, a predicted density of manufacturing defects and an area of the proposed integrated circuit chip.
Abstract:
A method and system for predicting manufacturing yield for a proposed integrated circuit The method includes: in the order recited: (a) providing a multiplicity of different integrated circuit library elements in a design database, each library element linked to a corresponding normalization factor in the design database; (b) selecting library elements from the design database to include in a proposed design for the integrated circuit; (c) generating an equivalent circuit count of the proposed design based on the normalization factors and a count of each different library element included in the proposed design; and (d) calculating a predicted manufacturing yield based on the equivalent circuit count, a predicted density of manufacturing defects and an area of the proposed integrated circuit chip.
Abstract:
Harvesting methods and apparatus provide endless movable arrays of finger members for contacting and strippingly lifting fruits from plants in growing fields with each of the arrays being generally upstanding, longitudinally elongated and having at least a portion which is substantially planar along which the finger members endlessly move upwardly while strippingly lifting the fruits from the plants as the apparatus travels through the growing field.
Abstract:
Method and apparatus for harvesting vinous crops includes cutting a fruit-carrying vine mass from its growing roots, sweeping the vine mass with rotary reel motion onto a upwardly inclined endless conveyor for carriage to a position of commencement of a first arcuate path and thereafter carrying the vine mass along the arcuate path by first lifting and then lowering the vine mass while imparting vibratory motion to the vine mass to separate fruit from vines of the mass.
Abstract:
A circuit for filtering single event effect (SEE) induced glitches is disclosed. The circuit for filtering SEE induced glitches comprises an SEE immune latch circuit and a delay element. The SEE immune latch circuit includes a first input, a second input, and an output. The SEE immune latch changes from one state to another state only upon having incoming input signals of identical polarity being applied contemporaneously at both the first input and the second input. The first input of the SEE immune latch circuit is directly connected to a signal input, and the second input of the SEE immune latch circuit is connected to the signal input via the delay element. The delay element provides a signal delay time equal to or greater than a pulse width of an SEE induced glitch but less than a pre-determined pulse width of an incoming signal at the signal input under normal operation. By connecting the delay element between the signal input and the second input of the SEE immune latch circuit, a temporal separation greater that the duration of an SEE induced glitch can be achieved on the data being drive into the first and the second inputs of the SEE immune latch circuit. As a result, SEE induced glitches will not be written into the SEE immune latch circuit.