公开(公告)号：US20050071788A1

公开(公告)日：2005-03-31

申请号：US10605379

申请日：2003-09-26

申请人： Jeanne Bickford ,  Edward Evans ,  Sean Horner ,  Raymond Rosner ,  Andrew Wienick ,  Joseph Yoder

发明人： Jeanne Bickford ,  Edward Evans ,  Sean Horner ,  Raymond Rosner ,  Andrew Wienick ,  Joseph Yoder

IPC分类号： G06F17/50

CPC分类号： G06F17/5045

摘要： A method and system for predicting manufacturing yield for a proposed integrated circuit The method includes: in the order recited: (a) providing a multiplicity of different integrated circuit library elements in a design database, each library element linked to a corresponding normalization factor in the design database; (b) selecting library elements from the design database to include in a proposed design for the integrated circuit; (c) generating an equivalent circuit count of the proposed design based on the normalization factors and a count of each different library element included in the proposed design; and (d) calculating a predicted manufacturing yield based on the equivalent circuit count, a predicted density of manufacturing defects and an area of the proposed integrated circuit chip.

摘要翻译： 一种用于预测所提出的集成电路的制造产量的方法和系统。该方法包括：按照所述的顺序：（a）在设计数据库中提供多个不同的集成电路库元件，每个库元件链接到相应的归一化因子 设计数据库; （b）从设计数据库中选择库元素以包含在集成电路的拟议设计中; （c）基于归一化因子和所提出的设计中包括的每个不同的库元素的计数产生所提出的设计的等效电路数; 以及（d）基于等效电路数，制造缺陷的预测密度和所提出的集成电路芯片的面积来计算预计制造产量。

公开(公告)号：US07013441B2

公开(公告)日：2006-03-14

申请号：US10605379

申请日：2003-09-26

申请人： Jeanne P. Bickford ,  Edward K. Evans ,  Sean Horner ,  Raymond J. Rosner ,  Andrew Wienick ,  Joseph Yoder

发明人： Jeanne P. Bickford ,  Edward K. Evans ,  Sean Horner ,  Raymond J. Rosner ,  Andrew Wienick ,  Joseph Yoder

IPC分类号： G06F17/50

CPC分类号： G06F17/5045

摘要： A method and system for predicting manufacturing yield for a proposed integrated circuit The method includes: in the order recited: (a) providing a multiplicity of different integrated circuit library elements in a design database, each library element linked to a corresponding normalization factor in the design database; (b) selecting library elements from the design database to include in a proposed design for the integrated circuit; (c) generating an equivalent circuit count of the proposed design based on the normalization factors and a count of each different library element included in the proposed design; and (d) calculating a predicted manufacturing yield based on the equivalent circuit count, a predicted density of manufacturing defects and an area of the proposed integrated circuit chip.

摘要翻译： 一种用于预测所提出的集成电路的制造产量的方法和系统。该方法包括：按照所述的顺序：（a）在设计数据库中提供多个不同的集成电路库元件，每个库元件链接到相应的归一化因子 设计数据库; （b）从设计数据库中选择库元素以包含在集成电路的拟议设计中; （c）基于归一化因子和所提出的设计中包括的每个不同的库元素的计数产生所提出的设计的等效电路数; 以及（d）基于等效电路数，制造缺陷的预测密度和所提出的集成电路芯片的面积来计算预计制造产量。

公开(公告)号：US20070266349A1

公开(公告)日：2007-11-15

申请号：US11382371

申请日：2006-05-09

申请人： Jesse Craig ,  Scott Vento ,  Stanley Stanski ,  Andrew Wienick

发明人： Jesse Craig ,  Scott Vento ,  Stanley Stanski ,  Andrew Wienick

IPC分类号： G06F17/50 ,  G06F11/00 ,  G01R31/28

CPC分类号： G01R31/318385 ,  G06F11/263

摘要： A directed random verification system and method analyzes a pair of generated test cases, from a pool of generated test cases which are capable of testing at least a portion of an untested coverage event, and finds a logical, deterministic crossover point between at least two test cases. Once a pair of test cases with at least one crossover point has been identified the method crosses a portion of the random number trace up to the crossover point with a portion of the second random number trace, which continues from the crossover point. The result is a new random number trace that is a combination of a portion of one test and a portion of another test. The new random number trace is sent to the stimulus generator as the new random number input.

摘要翻译： 定向随机验证系统和方法从生成的测试用例池中分析一对生成的测试用例，该测试用例能够测试至少一部分未经测试的覆盖事件，并在至少两个测试之间找到逻辑的确定性交叉点 案件 一旦已经确定了具有至少一个交叉点的一对测试用例，该方法将随机数曲线的一部分与第二随机数迹线的一部分交叉到交叉点，该部分从交叉点继续。 结果是一个新的随机数迹线，它是一个测试的一部分和另一个测试的一部分的组合。 新的随机数字轨迹作为新的随机数输入发送到刺激发生器。

公开(公告)号：US20070168759A1

公开(公告)日：2007-07-19

申请号：US11164646

申请日：2005-11-30

申请人： Kenneth Goodnow ,  Oscar Strohacker ,  Mark Styduhar ,  Peter Twombly ,  Andrew Wienick ,  Paul Zuchowski ,  Stephen Shuma

发明人： Kenneth Goodnow ,  Oscar Strohacker ,  Mark Styduhar ,  Peter Twombly ,  Andrew Wienick ,  Paul Zuchowski ,  Stephen Shuma

IPC分类号： G06F11/00

CPC分类号： G06F11/008

摘要： Disclosed are embodiments of a method and an associated first system for extending product life of a second system in the presence of phenomena that cause the exhibition of both performance degradation and recovery properties within system devices. The first system includes duplicate devices incorporated into the second system (e.g., on a shared bus). These duplicate devices are adapted to independently perform the same function within that second system. Reference signal generators, a reference signal comparator, a power controller and a state machine, working in combination, can be adapted to seamlessly switch performance of that same function within the second system between the duplicate devices based on a measurement of performance degradation to allow for device recovery. A predetermined policy accessible by the state machine dictates when and whether or not to initiate a switch.

摘要翻译： 公开了一种方法和相关联的第一系统的实施例，用于在存在导致在系统设备内展现性能下降和恢复性能的现象的情况下延长第二系统的产品寿命。 第一系统包括并入第二系统中的重复设备（例如，在共享总线上）。 这些重复设备适于在该第二系统内独立地执行相同的功能。 参考信号发生器，参考信号比较器，功率控制器和状态机组合起来可以适应于基于性能下降的测量来在复制设备之间的第二系统内的相同功能的无缝切换性能，以允许 设备恢复。 状态机可访问的预定策略指示何时以及是否启动切换。