公开(公告)号：US07759962B2

公开(公告)日：2010-07-20

申请号：US12252904

申请日：2008-10-16

Applicant: Jiaw-Ren Shih ,  Neeraj Kumar Jha ,  Rakesh Ranjan ,  Naresh Kumar Emani

Inventor： Jiaw-Ren Shih ,  Neeraj Kumar Jha ,  Rakesh Ranjan ,  Naresh Kumar Emani

IPC: G01R31/26

CPC classification number: G01R31/2874 ,  G01R31/2858

Abstract: A method for performing a bias temperature instability test on a device includes performing a first stress on the device. After the first stress, a first measurement is performed to determine a first parameter of the device. After the first measurement, a second stress is performed on the device, wherein only the first parameter is measured between the first stress and the second stress. The method further includes performing a second measurement to determine a second parameter of the device after the second stress. The second parameter is different from the first parameter.

Abstract translation: 用于对设备执行偏置温度不稳定性测试的方法包括在设备上执行第一应力。 在第一次应力之后，进行第一次测量以确定该装置的第一个参数。 在第一次测量之后，在该装置上执行第二应力，其中在第一应力和第二应力之间仅测量第一参数。 该方法还包括执行第二测量以确定第二应力之后的装置的第二参数。 第二个参数与第一个参数不同。

公开(公告)号：US20100097091A1

公开(公告)日：2010-04-22

申请号：US12252904

申请日：2008-10-16

Applicant: Jiaw-Ren Shih ,  Neeraj Kumar Jha ,  Rakesh Ranjan ,  Naresh Kumar Emani

Inventor： Jiaw-Ren Shih ,  Neeraj Kumar Jha ,  Rakesh Ranjan ,  Naresh Kumar Emani

IPC: G01R31/26

CPC classification number: G01R31/2874 ,  G01R31/2858

Abstract: A method for performing a bias temperature instability test on a device includes performing a first stress on the device. After the first stress, a first measurement is performed to determine a first parameter of the device. After the first measurement, a second stress is performed on the device, wherein only the first parameter is measured between the first stress and the second stress. The method further includes performing a second measurement to determine a second parameter of the device after the second stress. The second parameter is different from the first parameter.

Abstract translation: 用于对设备执行偏置温度不稳定性测试的方法包括在设备上执行第一应力。 在第一次应力之后，进行第一次测量以确定该装置的第一个参数。 在第一次测量之后，在该装置上执行第二应力，其中在第一应力和第二应力之间仅测量第一参数。 该方法还包括执行第二测量以确定第二应力之后的装置的第二参数。 第二个参数与第一个参数不同。