公开(公告)号：US20140194069A1

公开(公告)日：2014-07-10

申请号：US13738506

申请日：2013-01-10

Applicant: APPLE INC.

Inventor： Song Liu ,  Tomoki Takeya ,  Adil Syed ,  Vishwanath Venkataraman

IPC: H04W24/00

CPC classification number: H04W24/00 ,  H04B17/29

Abstract: A test system may include test equipment for testing the radio-frequency performance of wireless electronic devices. The test equipment may provide radio-frequency downlink signals to a wireless electronic device under test (DUT). The test equipment may perform a power sweep by stepping down the downlink signals in signal power level to test receiver sensitivity for the DUT. The DUT may gather measurement data from the downlink signals. The test equipment may retrieve measurement data from the DUT after downlink signal transmission has ended. The test equipment may identify a trigger in the retrieved measurement data to ensure that the data is synchronized with the power sweep in the transmitted downlink signals. The test equipment may identify path loss information associated with the test system. The test equipment may compute receiver sensitivity values for the DUT based on the path loss information and retrieved measurement data.

Abstract translation: 测试系统可以包括用于测试无线电子设备的射频性能的测试设备。 测试设备可以向被测试的无线电子设备（DUT）提供射频下行链路信号。 测试设备可以通过降低信号功率级别的下行链路信号来执行功率扫描，以测试DUT的接收机灵敏度。 DUT可以从下行链路信号收集测量数据。 下行链路信号传输结束后，测试设备可以从DUT检索测量数据。 测试设备可以识别所检索的测量数据中的触发，以确保数据与传输的下行链路信号中的功率扫描同步。 测试设备可以识别与测试系统相关联的路径损耗信息。 测试设备可以基于路径损耗信息和检索的测量数据来计算DUT的接收机灵敏度值。

公开(公告)号：US09094840B2

公开(公告)日：2015-07-28

申请号：US13738506

申请日：2013-01-10

Applicant: Apple Inc.

Inventor： Song Liu ,  Tomoki Takeya ,  Adil Syed ,  Vishwanath Venkataraman

IPC: H04W24/00

CPC classification number: H04W24/00 ,  H04B17/29

Abstract: A test system may include test equipment for testing the radio-frequency performance of wireless electronic devices. The test equipment may provide radio-frequency downlink signals to a wireless electronic device under test (DUT). The test equipment may perform a power sweep by stepping down the downlink signals in signal power level to test receiver sensitivity for the DUT. The DUT may gather measurement data from the downlink signals. The test equipment may retrieve measurement data from the DUT after downlink signal transmission has ended. The test equipment may identify a trigger in the retrieved measurement data to ensure that the data is synchronized with the power sweep in the transmitted downlink signals. The test equipment may identify path loss information associated with the test system. The test equipment may compute receiver sensitivity values for the DUT based on the path loss information and retrieved measurement data.

Abstract translation: 测试系统可以包括用于测试无线电子设备的射频性能的测试设备。 测试设备可以向被测试的无线电子设备（DUT）提供射频下行链路信号。 测试设备可以通过降低信号功率级别的下行链路信号来执行功率扫描，以测试DUT的接收机灵敏度。 DUT可以从下行链路信号收集测量数据。 下行链路信号传输结束后，测试设备可以从DUT检索测量数据。 测试设备可以识别所检索的测量数据中的触发，以确保数据与传输的下行链路信号中的功率扫描同步。 测试设备可以识别与测试系统相关联的路径损耗信息。 测试设备可以基于路径损耗信息和检索的测量数据来计算DUT的接收机灵敏度值。