公开(公告)号：US09094840B2

公开(公告)日：2015-07-28

申请号：US13738506

申请日：2013-01-10

Applicant: Apple Inc.

Inventor： Song Liu ,  Tomoki Takeya ,  Adil Syed ,  Vishwanath Venkataraman

IPC: H04W24/00

CPC classification number: H04W24/00 ,  H04B17/29

Abstract: A test system may include test equipment for testing the radio-frequency performance of wireless electronic devices. The test equipment may provide radio-frequency downlink signals to a wireless electronic device under test (DUT). The test equipment may perform a power sweep by stepping down the downlink signals in signal power level to test receiver sensitivity for the DUT. The DUT may gather measurement data from the downlink signals. The test equipment may retrieve measurement data from the DUT after downlink signal transmission has ended. The test equipment may identify a trigger in the retrieved measurement data to ensure that the data is synchronized with the power sweep in the transmitted downlink signals. The test equipment may identify path loss information associated with the test system. The test equipment may compute receiver sensitivity values for the DUT based on the path loss information and retrieved measurement data.

Abstract translation: 测试系统可以包括用于测试无线电子设备的射频性能的测试设备。 测试设备可以向被测试的无线电子设备（DUT）提供射频下行链路信号。 测试设备可以通过降低信号功率级别的下行链路信号来执行功率扫描，以测试DUT的接收机灵敏度。 DUT可以从下行链路信号收集测量数据。 下行链路信号传输结束后，测试设备可以从DUT检索测量数据。 测试设备可以识别所检索的测量数据中的触发，以确保数据与传输的下行链路信号中的功率扫描同步。 测试设备可以识别与测试系统相关联的路径损耗信息。 测试设备可以基于路径损耗信息和检索的测量数据来计算DUT的接收机灵敏度值。

公开(公告)号：US20140194069A1

公开(公告)日：2014-07-10

申请号：US13738506

申请日：2013-01-10

Applicant: APPLE INC.

Inventor： Song Liu ,  Tomoki Takeya ,  Adil Syed ,  Vishwanath Venkataraman

IPC: H04W24/00

CPC classification number: H04W24/00 ,  H04B17/29

Abstract: A test system may include test equipment for testing the radio-frequency performance of wireless electronic devices. The test equipment may provide radio-frequency downlink signals to a wireless electronic device under test (DUT). The test equipment may perform a power sweep by stepping down the downlink signals in signal power level to test receiver sensitivity for the DUT. The DUT may gather measurement data from the downlink signals. The test equipment may retrieve measurement data from the DUT after downlink signal transmission has ended. The test equipment may identify a trigger in the retrieved measurement data to ensure that the data is synchronized with the power sweep in the transmitted downlink signals. The test equipment may identify path loss information associated with the test system. The test equipment may compute receiver sensitivity values for the DUT based on the path loss information and retrieved measurement data.

Abstract translation: 测试系统可以包括用于测试无线电子设备的射频性能的测试设备。 测试设备可以向被测试的无线电子设备（DUT）提供射频下行链路信号。 测试设备可以通过降低信号功率级别的下行链路信号来执行功率扫描，以测试DUT的接收机灵敏度。 DUT可以从下行链路信号收集测量数据。 下行链路信号传输结束后，测试设备可以从DUT检索测量数据。 测试设备可以识别所检索的测量数据中的触发，以确保数据与传输的下行链路信号中的功率扫描同步。 测试设备可以识别与测试系统相关联的路径损耗信息。 测试设备可以基于路径损耗信息和检索的测量数据来计算DUT的接收机灵敏度值。

公开(公告)号：US20140315495A1

公开(公告)日：2014-10-23

申请号：US13868508

申请日：2013-04-23

Applicant: APPLE INC.

Inventor： Brian C. Joseph ,  Song Liu

IPC: H04W24/08

CPC classification number: H04W24/08 ,  H04W88/02

Abstract: A test system may test the radio-frequency (RF) performance of wireless electronic devices under test (DUTs). The RF performance of the DUTs may be characterized by a set of performance metrics. The test system may obtain correlation information for each performance metric in the set of performance metrics. The correlation information may identify predictor performance metrics and associated dependent performance metrics in the set of performance metrics. The test system may gather measurement data from a selected DUT by measuring the predictor performance metrics on the selected DUT. The production test station may generate a conditional probability distribution for the dependent performance metric given the measurement data and the correlation information. The production test station may determine whether to omit testing of the dependent performance metric for the selected DUT by comparing an area under the conditional probability distribution for the dependent performance metric to a predetermined threshold.

Abstract translation: 测试系统可以测试被测试的无线电子设备（DUT）的射频（RF）性能。 DUT的RF性能可以通过一组性能度量来表征。 测试系统可以在该组性能度量中获得每个性能度量的相关性信息。 相关性信息可以在性能度量集合中识别预测器性能度量和相关联的依赖性能度量。 测试系统可以通过测量所选DUT上的预测器性能指标来从所选DUT收集测量数据。 生产测试站可以产生给定测量数据和相关信息的依赖性能度量的条件概率分布。 生产测试站可以通过将依赖性能度量的条件概率分布下的面积与预定阈值进行比较，来确定是否省略对所选DUT的依赖性能度量的测试。