公开(公告)号：US20140194069A1

公开(公告)日：2014-07-10

申请号：US13738506

申请日：2013-01-10

Applicant: APPLE INC.

Inventor： Song Liu ,  Tomoki Takeya ,  Adil Syed ,  Vishwanath Venkataraman

IPC: H04W24/00

CPC classification number: H04W24/00 ,  H04B17/29

Abstract: A test system may include test equipment for testing the radio-frequency performance of wireless electronic devices. The test equipment may provide radio-frequency downlink signals to a wireless electronic device under test (DUT). The test equipment may perform a power sweep by stepping down the downlink signals in signal power level to test receiver sensitivity for the DUT. The DUT may gather measurement data from the downlink signals. The test equipment may retrieve measurement data from the DUT after downlink signal transmission has ended. The test equipment may identify a trigger in the retrieved measurement data to ensure that the data is synchronized with the power sweep in the transmitted downlink signals. The test equipment may identify path loss information associated with the test system. The test equipment may compute receiver sensitivity values for the DUT based on the path loss information and retrieved measurement data.

Abstract translation: 测试系统可以包括用于测试无线电子设备的射频性能的测试设备。 测试设备可以向被测试的无线电子设备（DUT）提供射频下行链路信号。 测试设备可以通过降低信号功率级别的下行链路信号来执行功率扫描，以测试DUT的接收机灵敏度。 DUT可以从下行链路信号收集测量数据。 下行链路信号传输结束后，测试设备可以从DUT检索测量数据。 测试设备可以识别所检索的测量数据中的触发，以确保数据与传输的下行链路信号中的功率扫描同步。 测试设备可以识别与测试系统相关联的路径损耗信息。 测试设备可以基于路径损耗信息和检索的测量数据来计算DUT的接收机灵敏度值。

公开(公告)号：US20140179239A1

公开(公告)日：2014-06-26

申请号：US13725769

申请日：2012-12-21

Applicant: APPLE INC.

Inventor： Joshua G. Nickel ,  Jr-Yi Shen ,  Anand Lakshmanan ,  Jayesh Nath ,  Matthew A. Mow ,  Mattia Pascolini ,  Vishwanath Venkataraman ,  Peter Bevelacqua ,  Xin Cui

IPC: H04W24/00

CPC classification number: H04W24/00 ,  G01R27/26 ,  G01R27/28 ,  G01R29/08 ,  G01R29/10 ,  G01R31/2822 ,  H04B17/12

Abstract: A wireless electronic device may contain at least one adjustable antenna tuning element for use in tuning the operating frequency range of the device. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, and other load circuits that provide desired impedance characteristics. A test system that is used for performing passive radio-frequency (RF) testing on antenna tuning elements in partially assembled devices is provided. The test system may include an RF tester and a test host. The tester may be used to gather scattering parameter measurements from the antenna tuning element. The test host may be used to ensure that power and appropriate control signals are being supplied to the antenna tuning element so that the antenna tuning element is placed in desired tuning states during testing.

Abstract translation: 无线电子设备可以包含用于调整设备的工作频率范围的至少一个可调天线调谐元件。 天线调谐元件可以包括射频开关，连续/半连续可调组件，例如可调电阻器，电感器和电容器，以及提供所需阻抗特性的其它负载电路。 提供了一种用于对部分组装的设备中的天线调谐元件进行无源射频（RF）测试的测试系统。 测试系统可以包括RF测试器和测试主机。 测试仪可用于从天线调谐元件收集散射参数测量值。 可以使用测试主机来确保向天线调谐元件提供功率和适当的控制信号，使得天线调谐元件在测试期间被置于期望的调谐状态。

公开(公告)号：US09084124B2

公开(公告)日：2015-07-14

申请号：US13725769

申请日：2012-12-21

Applicant: Apple Inc.

Inventor： Joshua G. Nickel ,  Jr-Yi Shen ,  Anand Lakshmanan ,  Jayesh Nath ,  Matthew A. Mow ,  Mattia Pascolini ,  Vishwanath Venkataraman ,  Peter Bevelacqua ,  Xin Cui

IPC: H04B1/04 ,  H04W24/00 ,  G01R31/28 ,  H04B17/12 ,  G01R27/26 ,  G01R29/08 ,  G01R27/28 ,  G01R29/10

CPC classification number: H04W24/00 ,  G01R27/26 ,  G01R27/28 ,  G01R29/08 ,  G01R29/10 ,  G01R31/2822 ,  H04B17/12

Abstract: A wireless electronic device may contain at least one adjustable antenna tuning element for use in tuning the operating frequency range of the device. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, and other load circuits that provide desired impedance characteristics. A test system that is used for performing passive radio-frequency (RF) testing on antenna tuning elements in partially assembled devices is provided. The test system may include an RF tester and a test host. The tester may be used to gather scattering parameter measurements from the antenna tuning element. The test host may be used to ensure that power and appropriate control signals are being supplied to the antenna tuning element so that the antenna tuning element is placed in desired tuning states during testing.

Abstract translation: 无线电子设备可以包含用于调整设备的工作频率范围的至少一个可调天线调谐元件。 天线调谐元件可以包括射频开关，连续/半连续可调组件，例如可调电阻器，电感器和电容器，以及提供所需阻抗特性的其它负载电路。 提供了一种用于对部分组装的设备中的天线调谐元件进行无源射频（RF）测试的测试系统。 测试系统可以包括RF测试器和测试主机。 测试仪可用于从天线调谐元件收集散射参数测量值。 可以使用测试主机来确保向天线调谐元件提供功率和适当的控制信号，使得天线调谐元件在测试期间被置于期望的调谐状态。

公开(公告)号：US09404965B2

公开(公告)日：2016-08-02

申请号：US14137770

申请日：2013-12-20

Applicant: Apple Inc.

Inventor： Joshua G. Nickel ,  Erica J. Tong ,  Vishwanath Venkataraman

IPC: G01R27/04 ,  G01R27/32 ,  G01R31/302 ,  G01R31/28

CPC classification number: G01R31/3025 ,  G01R31/2822

Abstract: A test system is provided for performing radio-frequency tests on an electronic device under test (DUT) having multiple antennas. The test system may include a test unit for generating radio-frequency test signals, a test enclosure, and a test antenna fixture. The test fixture may include tunable antenna circuitry, antenna tuning elements, a test sensor, a microcontroller, a battery, and a solar cell that charges the battery, each of which is mounted on a test fixture within the test enclosure. The test sensor may be used to detect stimuli issued by the DUT. In response to detecting the stimuli, the microcontroller may send control signals to the antenna tuning elements to configure the antenna circuitry in different modes. Each of the different modes may be optimized to test a selected one of the multiple antennas in the DUT when operating using different radio access technologies and at different frequencies.

Abstract translation: 提供了一种用于在具有多个天线的被测电子设备（DUT）上进行射频测试的测试系统。 测试系统可以包括用于产生射频测试信号的测试单元，测试机箱和测试天线固定装置。 测试夹具可以包括可调天线电路，天线调谐元件，测试传感器，微控制器，电池和对电池充电的太阳能电池，每个电池安装在测试外壳内的测试夹具上。 测试传感器可用于检测由DUT发出的刺激。 响应于检测到刺激，微控制器可以向天线调谐元件发送控制信号以将天线电路配置为不同的模式。 当使用不同的无线电接入技术和不同的频率进行操作时，可以优化每个不同的模式来测试DUT中的多个天线中的选定的一个。

公开(公告)号：US20160072594A1

公开(公告)日：2016-03-10

申请号：US14477703

申请日：2014-09-04

Applicant: Apple Inc.

Inventor： Chao Yuan ,  Wassim El-Hassan ,  Vishwanath Venkataraman

IPC: H04B17/00

CPC classification number: H04B17/0085 ,  H04B17/16 ,  H04B17/19 ,  H04B17/21

Abstract: Radio-frequency performance of wireless communications circuitry on an electronic device under test (DUT) may be tested without external test equipment such as signal analyzers or signal generators. A first DUT may transmit test signals to a second DUT. External attenuator circuitry interposed between the DUTs may attenuate the test signals to desired power levels. The second DUT may characterize and/or calibrate receiver performance by generating wireless performance metric data based on the attenuated test signals. A single DUT may transmit test signals to itself via corresponding transmit and receive ports coupled together through the attenuator. The DUT may generate performance metric data based on the test signals. The DUT may include feedback receiver circuitry coupled to an output of a transmitter via a feedback, path and may characterize and/or calibrate transmit performance using test signals transmitted by the transmitter and received by the feedback receiver.

Abstract translation: 可以在没有外部测试设备（如信号分析仪或信号发生器）的情况下测试被测电子设备（DUT）上的无线通信电路的射频性能。 第一DUT可以将测试信号发送到第二DUT。 插入在DUT之间的外部衰减器电路可以将测试信号衰减到期望的功率电平。 第二DUT可以通过基于衰减的测试信号产生无线性能度量数据来表征和/或校准接收机性能。 单个DUT可以通过经由衰减器耦合在一起的对应的发射和接收端口将测试信号发送到自身。 DUT可以基于测试信号生成性能度量数据。 DUT可以包括经由反馈路径耦合到发射机的输出的反馈接收器电路，并且可以使用由发射器发送并由反馈接收器接收的测试信号来表征和/或校准发射性能。

公开(公告)号：US09876588B2

公开(公告)日：2018-01-23

申请号：US14477703

申请日：2014-09-04

Applicant: Apple Inc.

Inventor： Chao Yuan ,  Wassim El-Hassan ,  Vishwanath Venkataraman

IPC: H04B17/00 ,  H04B17/16 ,  H04B17/19 ,  H04B17/21

CPC classification number: H04B17/0085 ,  H04B17/16 ,  H04B17/19 ,  H04B17/21

Abstract: Radio-frequency performance of wireless communications circuitry on an electronic device under test (DUT) may be tested without external test equipment such as signal analyzers or signal generators. A first DUT may transmit test signals to a second DUT. External attenuator circuitry interposed between the DUTs may attenuate the test signals to desired power levels. The second DUT may characterize and/or calibrate receiver performance by generating wireless performance metric data based on the attenuated test signals. A single DUT may transmit test signals to itself via corresponding transmit and receive ports coupled together through the attenuator. The DUT may generate performance metric data based on the test signals. The DUT may include feedback receiver circuitry coupled to an output of a transmitter via a feedback path and may characterize and/or calibrate transmit performance using test signals transmitted by the transmitter and received by the feedback receiver.

公开(公告)号：US09094840B2

公开(公告)日：2015-07-28

申请号：US13738506

申请日：2013-01-10

Applicant: Apple Inc.

Inventor： Song Liu ,  Tomoki Takeya ,  Adil Syed ,  Vishwanath Venkataraman

IPC: H04W24/00

CPC classification number: H04W24/00 ,  H04B17/29

Abstract: A test system may include test equipment for testing the radio-frequency performance of wireless electronic devices. The test equipment may provide radio-frequency downlink signals to a wireless electronic device under test (DUT). The test equipment may perform a power sweep by stepping down the downlink signals in signal power level to test receiver sensitivity for the DUT. The DUT may gather measurement data from the downlink signals. The test equipment may retrieve measurement data from the DUT after downlink signal transmission has ended. The test equipment may identify a trigger in the retrieved measurement data to ensure that the data is synchronized with the power sweep in the transmitted downlink signals. The test equipment may identify path loss information associated with the test system. The test equipment may compute receiver sensitivity values for the DUT based on the path loss information and retrieved measurement data.

Abstract translation: 测试系统可以包括用于测试无线电子设备的射频性能的测试设备。 测试设备可以向被测试的无线电子设备（DUT）提供射频下行链路信号。 测试设备可以通过降低信号功率级别的下行链路信号来执行功率扫描，以测试DUT的接收机灵敏度。 DUT可以从下行链路信号收集测量数据。 下行链路信号传输结束后，测试设备可以从DUT检索测量数据。 测试设备可以识别所检索的测量数据中的触发，以确保数据与传输的下行链路信号中的功率扫描同步。 测试设备可以识别与测试系统相关联的路径损耗信息。 测试设备可以基于路径损耗信息和检索的测量数据来计算DUT的接收机灵敏度值。

公开(公告)号：US20150177277A1

公开(公告)日：2015-06-25

申请号：US14137770

申请日：2013-12-20

Applicant: Apple Inc.

Inventor： Joshua G. Nickel ,  Erica J. Tong ,  Vishwanath Venkataraman

IPC: G01R1/07 ,  G01R27/02 ,  G01R31/00

CPC classification number: G01R31/3025 ,  G01R31/2822

Abstract: A test system is provided for performing radio-frequency tests on an electronic device under test (DUT) having multiple antennas. The test system may include a test unit for generating radio-frequency test signals, a test enclosure, and a test antenna fixture. The test fixture may include tunable antenna circuitry, antenna tuning elements, a test sensor, a microcontroller, a battery, and a solar cell that charges the battery, each of which is mounted on a test fixture within the test enclosure. The test sensor may be used to detect stimuli issued by the DUT. In response to detecting the stimuli, the microcontroller may send control signals to the antenna tuning elements to configure the antenna circuitry in different modes. Each of the different modes may be optimized to test a selected one of the multiple antennas in the DUT when operating using different radio access technologies and at different frequencies.

Abstract translation: 提供了一种用于在具有多个天线的被测电子设备（DUT）上进行射频测试的测试系统。 测试系统可以包括用于产生射频测试信号的测试单元，测试机箱和测试天线固定装置。 测试夹具可以包括可调天线电路，天线调谐元件，测试传感器，微控制器，电池和对电池充电的太阳能电池，每个电池安装在测试外壳内的测试夹具上。 测试传感器可用于检测由DUT发出的刺激。 响应于检测到刺激，微控制器可以向天线调谐元件发送控制信号以将天线电路配置为不同的模式。 当使用不同的无线电接入技术和不同的频率进行操作时，可以优化每个不同的模式来测试DUT中的多个天线中的选定的一个。