公开(公告)号：US20170293541A1

公开(公告)日：2017-10-12

申请号：US15447673

申请日：2017-03-02

Applicant: ARM Limited

Inventor： Balaji VENU ,  Kauser Yakub JOHAR ,  Marco BONINO

IPC: G06F11/22 ,  G06F11/273 ,  G06F11/27

CPC classification number: G06F11/27 ,  G06F11/0721 ,  G06F11/0766 ,  G06F11/0775 ,  G06F11/0784 ,  G06F11/22 ,  G06F11/2236 ,  G06F11/2242 ,  G06F11/2284 ,  G06F11/24 ,  G06F11/273

Abstract: Apparatus and a method for processor core self-testing are disclosed. The apparatus comprises processor core circuitry to perform data processing operations by executing data processing instructions. Separate self-test control circuitry causes the processor core circuitry to temporarily switch from a first state of executing the data processing instructions to a second state of executing a self-test sequence of instructions, before returning to the first state of executing the data processing instructions without a reboot of the processor core circuitry being required. There is also self-test support circuitry, wherein the processor core circuitry is responsive to the self-test sequence of instructions to cause an export of at least one self-test data item via the self-test support circuitry to the self-test control circuitry.