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公开(公告)号:US20170285487A1
公开(公告)日:2017-10-05
申请号:US15623091
申请日:2017-06-14
Applicant: ASML NETHERLANDS B.V.
Inventor: Ivo Adam Johannes THOMAS , Siebe LANDHEER , Arnout Johannes MEESTER , Marcio Alexandre Cano MIRANDA , Gheorghe TANASA
CPC classification number: G03F7/70341 , G03B27/52 , G03F7/70891
Abstract: A lithographic apparatus comprising a projection system, and a liquid confinement structure configured to at least partly confine immersion liquid to an immersion space defined by the projection system, the liquid confinement structure and a substrate and/or substrate table is disclosed wherein a measure is taken to reduce the effect of droplets and/or a liquid film on the last element of the projection system.