公开(公告)号：US10211882B2

公开(公告)日：2019-02-19

申请号：US15316626

申请日：2015-06-26

Applicant: Alcatel Lucent

Inventor： Ruben Catteeuw ,  Geert Ysebaert ,  Geert Heyninck

IPC: H04B3/32 ,  H04M11/06 ,  H04B3/487

Abstract: In one embodiment the method includes assigning a common frequency range over which first sets of carriers are configured for communication over respective ones of a plurality of subscriber lines. The plurality of subscriber lines are dispatched between a plurality of autonomous vectoring processors configured to mitigate crosstalk between subscriber lines coupled thereto, thereby organizing the plurality of subscriber lines into a plurality of distinct vectoring groups. The method includes assigning a plurality of additional disjoint frequency ranges to respective ones of the plurality of vectoring groups over which second sets of carriers are configured for enhanced communication over respective ones of the plurality of subscriber lines. The second sets of carriers are configured over the respective disjoint frequency ranges assigned to the respective vectoring groups which the respective subscriber lines belong to.

公开(公告)号：US10171652B2

公开(公告)日：2019-01-01

申请号：US15520498

申请日：2015-11-12

Applicant: Alcatel Lucent

Inventor： Paschalis Tsiaflakis ,  Jochen Maes ,  Dirk Vanderhaegen ,  Geert Ysebaert ,  Wim Van Damme

IPC: H04M3/18 ,  H04L1/00 ,  H04L1/20 ,  H04L1/24 ,  H04L25/03 ,  H04B3/487 ,  H04B3/32 ,  H04L12/28 ,  H04M3/22 ,  H04M11/06

Abstract: In accordance with an embodiment the method includes temporarily configuring the vector processor with a new set of vectoring coefficients during one or more selected symbol positions; restoring the current set of vectoring coefficients outside the one or more selected symbol positions; obtaining at least one error measure over respectively at least one line of the group of vectored lines during the one or more selected symbol positions; and determining a suitability indication for the new set of vectoring coefficients based on the obtained at least one error measure.