公开(公告)号：US20190361071A1

公开(公告)日：2019-11-28

申请号：US16513562

申请日：2019-07-16

Applicant: Analog Devices Global

Inventor： Edward John Coyne ,  Alan J. O'Donnell ,  Shaun Bradley ,  David Aherne ,  David Boland ,  Thomas G. O'Dwyer ,  Colm Patrick Heffernan ,  Kevin B. Manning ,  Mark Forde ,  David J. Clarke ,  Michael A. Looby

IPC: G01R31/28 ,  G01N27/04

Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

公开(公告)号：US20210088580A1

公开(公告)日：2021-03-25

申请号：US17062225

申请日：2020-10-02

Applicant: Analog Devices Global

Inventor： Edward John Coyne ,  Alan J. O'Donnell ,  Shaun Bradley ,  David Aherne ,  David Boland ,  Thomas G. O'Dwyer ,  Colm Patrick Heffernan ,  Kevin B. Manning ,  Mark Forde ,  David J. Clarke ,  Michael A. Looby

IPC: G01R31/28 ,  G01N27/04

Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

公开(公告)号：US10794950B2

公开(公告)日：2020-10-06

申请号：US16513562

申请日：2019-07-16

Applicant: Analog Devices Global

Inventor： Edward John Coyne ,  Alan J. O'Donnell ,  Shaun Bradley ,  David Aherne ,  David Boland ,  Thomas G. O'Dwyer ,  Colm Patrick Heffernan ,  Kevin B. Manning ,  Mark Forde ,  David J. Clarke ,  Michael A. Looby

IPC: G01R31/28 ,  G01N27/04

Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

公开(公告)号：US10365322B2

公开(公告)日：2019-07-30

申请号：US15490584

申请日：2017-04-18

Applicant: Analog Devices Global

Inventor： Edward John Coyne ,  Alan J. O'Donnell ,  Shaun Bradley ,  David Aherne ,  David Boland ,  Thomas G. O'Dwyer ,  Colm Patrick Heffernan ,  Kevin B. Manning ,  Mark Forde ,  David J. Clarke ,  Michael A. Looby

IPC: G01R31/28

Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

公开(公告)号：US20170299650A1

公开(公告)日：2017-10-19

申请号：US15490584

申请日：2017-04-18

Applicant: Analog Devices Global

Inventor： Edward John Coyne ,  Alan J. O'Donnell ,  Shaun Bradley ,  David Aherne ,  David Boland ,  Thomas G. O'Dwyer ,  Colm Patrick Heffernan ,  Kevin B. Manning ,  Mark Forde ,  David J. Clarke ,  Michael A. Looby

IPC: G01R31/28 ,  G01N27/04

CPC classification number: G01R31/2879 ,  G01R31/2874

Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.