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公开(公告)号:US20200258214A1
公开(公告)日:2020-08-13
申请号:US16414709
申请日:2019-05-16
Applicant: Applied Materials, Inc.
Inventor: Nojan Motamedi , Dominic J. Benvegnu , Boguslaw A. Swedek , Martin A. Josefowicz
Abstract: A layer thickness measurement system includes a support to hold a substrate, an optical sensor to capture a color image of at least a portion of the substrate, and a controller. The controller is configured to receive the color image from the optical sensor, store a function that provides a value representative of a thickness as a function of position along a predetermined path in a coordinate space of at least two dimensions including a first color channel and a second color channel, for a pixel of the color image determine a coordinate of the pixel in the coordinate space from color data in the color image, determine a position of a point on the predetermined path that is closest to the coordinate, and calculate a value representative of a thickness from the function and the position of the point on the predetermined path.
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公开(公告)号:US20210358113A1
公开(公告)日:2021-11-18
申请号:US17388961
申请日:2021-07-29
Applicant: Applied Materials, Inc.
Inventor: Nojan Motamedi , Dominic J. Benvegnu , Boguslaw A. Swedek , Martin A. Josefowicz
Abstract: A layer thickness measurement system includes a support to hold a substrate, an optical sensor to capture a color image of at least a portion of the substrate, and a controller. The controller is configured to receive the color image from the optical sensor, perform a color correction on the color image to generate an adjusted color image having increased color contrast, determine a coordinate of the pixel in a coordinate space of at least two dimensions including a first color channel and a second color channel from color data in the adjusted color image for each of the adjusted color image, and calculate a value representative of a thickness based on the coordinate of the pixel of the adjusted color image in the coordinate space.
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公开(公告)号:US11776109B2
公开(公告)日:2023-10-03
申请号:US17388961
申请日:2021-07-29
Applicant: Applied Materials, Inc.
Inventor: Nojan Motamedi , Dominic J. Benvegnu , Boguslaw A. Swedek , Martin A. Josefowicz
CPC classification number: G06T7/0006 , G01B11/06 , G06T5/009 , H01L21/67253 , G01B2210/56 , G06T2207/10024 , G06T2207/20208 , G06T2207/30148
Abstract: A layer thickness measurement system includes a support to hold a substrate, an optical sensor to capture a color image of at least a portion of the substrate, and a controller. The controller is configured to receive the color image from the optical sensor, perform a color correction on the color image to generate an adjusted color image having increased color contrast, determine a coordinate of the pixel in a coordinate space of at least two dimensions including a first color channel and a second color channel from color data in the adjusted color image for each of the adjusted color image, and calculate a value representative of a thickness based on the coordinate of the pixel of the adjusted color image in the coordinate space.
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公开(公告)号:US11100628B2
公开(公告)日:2021-08-24
申请号:US16414709
申请日:2019-05-16
Applicant: Applied Materials, Inc.
Inventor: Nojan Motamedi , Dominic J. Benvegnu , Boguslaw A. Swedek , Martin A. Josefowicz
Abstract: A layer thickness measurement system includes a support to hold a substrate, an optical sensor to capture a color image of at least a portion of the substrate, and a controller. The controller is configured to receive the color image from the optical sensor, store a function that provides a value representative of a thickness as a function of position along a predetermined path in a coordinate space of at least two dimensions including a first color channel and a second color channel, for a pixel of the color image determine a coordinate of the pixel in the coordinate space from color data in the color image, determine a position of a point on the predetermined path that is closest to the coordinate, and calculate a value representative of a thickness from the function and the position of the point on the predetermined path.
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