中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

5 records (took 0.015 seconds)

    Methods and devices for processing and retrieving defect information of product
    3.
    发明授权
    Methods and devices for processing and retrieving defect information of product 有权

    公开(公告)号：US12092587B2

    公开(公告)日：2024-09-17

    申请号：US17765595

    申请日：2021-04-30

    Applicant: Beijing Zhongxiangying Technology Co., Ltd. ,  BOE Technology Group Co., Ltd.

    Inventor： Haijin Wang ,  Chuan Wang ,  Tian Lan ,  Jianmin Wu ,  Yu Feng ,  Hong Wang ,  Yu Wang ,  Fan Zhang ,  Jiawei Ren ,  Jing Xue ,  Jianfeng Zeng

    IPC: G01N21/95

    CPC classification number: G01N21/95 ,  G01N2021/9511

    Abstract: The present disclosure provides a method for processing defect information of a product, which includes the following steps of: acquiring defect information on a current film layer and defect information on historical film layers; determining whether defect information exists at a target location of the historical film layer if defect information exists at a target location of the current film layer; if defect information exists for a corresponding location to the target location in at least one of the historical film layers, deleting the defect information detected at the target location in the current film layer; and if no defect information exists for the target location in any of the historical film layers, retaining the defect information detected at the target location in the current film layer. According to this, for the defect information on the current film layer, only the defect information caused by factors of the current film layer may be retained, and the defect information caused by the historical film layers will not be retained, and thus, on the one hand, the stored data volume may be reduced, and on the other hand, the complexity of subsequent analysis of defect information may be simplified.

    Stripping device and display substrate production line
    5.
    发明授权
    Stripping device and display substrate production line 有权

    公开(公告)号：US10137482B2

    公开(公告)日：2018-11-27

    申请号：US15506301

    申请日：2016-02-19

    Applicant: BOE Technology Group Co., Ltd. ,  Hefei BOE Optoelectronics Technology Co., Ltd.

    Inventor： Fan Zhang ,  Wei Hu ,  Xianhao Chen ,  Jianzhao Liu ,  Jianwei Wang ,  Zuhong Liu ,  Daeoh Oh

    IPC: B08B3/10 ,  B08B3/02 ,  G03F7/42 ,  G02F1/1333 ,  G02F1/13 ,  H01L21/67 ,  H01L21/677

    Abstract: A stripping device and a display substrate production line are provided. The stripping device comprises a stripping chamber. A stripping liquid with a set temperature is provided within the stripping chamber; the stripping device further comprising a liquid jet component, the liquid jet component includes a liquid supplying pipeline and a liquid jet head, the liquid supplying pipeline is configured to supply a cleaning liquid to the liquid jet head, the liquid jet head is configured to output the cleaning liquid, the liquid supplying pipeline is arranged in the stripping chamber, and the stripping liquid enables the cleaning liquid in the liquid supplying pipeline to reach the set temperature. The stripping device enables the cleaning liquid to reach the set temperature, such that the stripping liquid and the photoresist remaining on the display substrate are effectively removed, the stripping liquid is prevented from being separated out on the display substrate and is further prevented from being crystallized to block an output port of the liquid jet head; and the stripping device further effectively uses the thermal energy in the stripping chamber to save energy consumption.

Patent Agency Ranking