SYSTEM AND METHOD FOR SEPARATING DEFECTIVE DIES FROM WAFER
    1.
    发明申请
    SYSTEM AND METHOD FOR SEPARATING DEFECTIVE DIES FROM WAFER 有权
    从波浪中分离有缺陷的系统和方法

    公开(公告)号:US20100166535A1

    公开(公告)日:2010-07-01

    申请号:US12648234

    申请日:2009-12-28

    CPC classification number: H01L21/67144 H01L21/67271

    Abstract: A system separating defective dies from a wafer comprises a film frame platform and a pick-and-place device. The film frame platform comprises a support table assembly configured for supporting a film frame assembly and a platform surface configured to receive the placement of bins thereupon. The pick-and-place device is configured for moving in a linear manner between the support table assembly and the platform surface.

    Abstract translation: 将有缺陷的模具与晶片分离的系统包括胶片框架平台和拾取和放置装置。 胶片框架平台包括配置用于支撑胶片框架组件的支撑台组件和被配置成接收其上的盒的放置的平台表面。 拾取和放置装置被配置为在支撑台组件和平台表面之间以线性方式移动。

    SYSTEM AND METHOD FOR INSPECTING CHIPS IN A TRAY
    2.
    发明申请
    SYSTEM AND METHOD FOR INSPECTING CHIPS IN A TRAY 有权
    用于检查托盘中的卡盘的系统和方法

    公开(公告)号:US20090169094A1

    公开(公告)日:2009-07-02

    申请号:US12342586

    申请日:2008-12-23

    Applicant: CHENG TAO TSAI

    Inventor: CHENG TAO TSAI

    Abstract: A system for inspecting chips in a tray comprises a three-dimensional sensor, a focus computing unit, an image sensor and a focusing device. The three-dimensional sensor is used to obtain the height signals of surfaces of the chips. The focus computing unit calculates the focusing positions of chips. The surface inspection sensor is used to inspect the surfaces of the chips. The focusing device is used to bring the images of the surfaces of the chips into the focus of the image sensor.

    Abstract translation: 用于检查托盘中的芯片的系统包括三维传感器,聚焦计算单元,图像传感器和聚焦装置。 三维传感器用于获得芯片表面的高度信号。 焦点计算单元计算芯片的聚焦位置。 表面检测传感器用于检查芯片的表面。 聚焦装置用于将芯片表面的图像带入图像传感器的焦点。

    SYSTEM AND METHOD FOR INSPECTION OF CHIPS ON TRAY
    3.
    发明申请
    SYSTEM AND METHOD FOR INSPECTION OF CHIPS ON TRAY 有权
    用于检查托盘的系统和方法

    公开(公告)号:US20100063619A1

    公开(公告)日:2010-03-11

    申请号:US12555245

    申请日:2009-09-08

    CPC classification number: G01N21/956

    Abstract: A system for inspection of chips on a tray comprises an unloading arm device, a first support platform, and a plurality of first tray-handling apparatuses. The first support platform is disposed adjacent to the unloading arm device, movable along a first direction. The plurality of first tray-handling apparatuses are arrayed along the first direction on the first support platform. Each of the plurality of first tray-handling apparatuses provides a particular size of tray for inspection, different from the size of tray provided by other first tray-handling apparatuses, wherein the first platform is configured to move a desired one of the plurality of first tray handling apparatuses before the unloading arm device.

    Abstract translation: 用于检查托盘上的碎屑的系统包括卸载臂装置,第一支撑平台和多个第一托盘处理装置。 第一支撑平台设置成与卸载臂装置相邻,可沿着第一方向移动。 多个第一托盘处理装置沿着第一方向排列在第一支撑平台上。 多个第一托盘处理装置中的每一个提供用于检查的特定尺寸的托盘,其不同于由其他第一托盘处理装置提供的托盘的尺寸,其中第一平台被配置成移动多个第一托盘处理装置中期望的一个 卸载臂装置前的托盘处理装置。

    SYSTEM AND METHOD FOR INSPECTING CHIPS IN A TRAY AND TRAY HANDLING APPARATUS THEREOF
    4.
    发明申请
    SYSTEM AND METHOD FOR INSPECTING CHIPS IN A TRAY AND TRAY HANDLING APPARATUS THEREOF 有权
    用于检查托盘中托盘和托盘处理装置的系统和方法

    公开(公告)号:US20090214326A1

    公开(公告)日:2009-08-27

    申请号:US12391580

    申请日:2009-02-24

    Applicant: CHENG TAO TSAI

    Inventor: CHENG TAO TSAI

    Abstract: A tray handling apparatus comprises a plurality of guides, a chuck device, a linear movement device, and a rack and pinion device. A space defined by the erected guides is used to hold a tray stack. The chuck of the chuck device is located at the center position of the bottom area of the space. The linear movement device is used to move the chuck relative to the guides. The rack and pinion device is used to cause the guides to move symmetrically. When an operator moves any one of the guides, the other guides move symmetrically and the center of the bottom area of the space surrounded by the guides remains at the same location during the movement of the guides. The operator does not need to adjust the position of the chuck if the positions of the guides are changed.

    Abstract translation: 托盘处理装置包括多个引导件,卡盘装置,线性运动装置和齿条齿轮装置。 由竖立的引导件限定的空间用于固定托盘堆叠。 卡盘装置的卡盘位于空间底部区域的中心位置。 线性运动装置用于相对于导轨移动卡盘。 齿条和齿轮装置用于使引导件对称地移动。 当操作者移动任何一个引导件时,其他引导件对称地移动,并且由引导件包围的空间的底部区域的中心在引导件移动期间保持在相同位置。 如果导轨的位置改变,操作员不需要调整卡盘的位置。

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