公开(公告)号：US12112964B2

公开(公告)日：2024-10-08

申请号：US17679158

申请日：2022-02-24

申请人： Sheng-Hung Wang ,  Po-Hsiang Chang ,  Zhe-Min Liao

发明人： Sheng-Hung Wang ,  Po-Hsiang Chang ,  Zhe-Min Liao

IPC分类号： H01L21/673 ,  B25J15/06 ,  G01R31/28

CPC分类号： H01L21/67333 ,  B25J15/0616 ,  G01R31/2874 ,  G01R31/2893

摘要： The invention provides a chip carrier, a chip testing module and a chip handling module. The chip carrier for carrying a plurality of chips comprises a main body with an upper surface and a lower surface. The main body has a plurality of air guide holes, and two ends of each air guide hole are respectively exposed on the upper surface and the lower surface. A part of the air guide holes are defined as a first group, and the air guide holes of the first group are connected. The main body is made of conductive material.

公开(公告)号：US20240168087A1

公开(公告)日：2024-05-23

申请号：US18512234

申请日：2023-11-17

申请人： Turbodynamics GmbH

发明人： Stefan Thurmaier

IPC分类号： G01R31/28

CPC分类号： G01R31/2893 ,  G01R31/2834

摘要： The invention relates to a module for exchanging an interface unit in a test system with a handling unit and test unit for testing semiconductor elements. The module has a base element which is or can be attached to the test system, a holder for holding an interface unit, and guide elements which connect the holder to the base element. The guide elements are designed to guide the holder relative to the base element between the insertion position, in which the holder is located in the test system between the test unit and the handling unit, and the removal position, in which the holder is located outside an area between the test unit and the handling unit for exchanging the interface unit. Furthermore, at least one docking unit is provided, each with a docking element and a docking counter-element for coupling the holder to the base element in such a way that the coupling provides a rigid connection at least perpendicular to an interface plane. The docking element or the docking counter-element is attached to the holder and the docking counter-element or the docking element is attached to the base element, and the docking unit is designed for mechanically connecting and disconnecting the docking element to the docking mating element. The invention also relates to a test system with the module, methods for testing semiconductor elements and methods for exchanging interface units.

公开(公告)号：US11953519B2

公开(公告)日：2024-04-09

申请号：US17077834

申请日：2020-10-22

申请人： Teradyne, Inc.

发明人： Christopher James Bruno ,  Philip Luke Campbell ,  Adnan Khalid ,  Evgeny Polyakov ,  John Patrick Toscano

IPC分类号： G01R31/28 ,  G01R1/04

CPC分类号： G01R1/0458 ,  G01R1/045 ,  G01R31/2893

摘要： An example test system includes packs. The packs include test sockets for testing devices under test (DUTs) and at least some test electronics for performing tests on the DUTs in the test sockets. Different packs are configured to have different configurations. The different configurations include at least different numbers of test sockets arranged at different pitches.

公开(公告)号：US11879934B2

公开(公告)日：2024-01-23

申请号：US17735130

申请日：2022-05-03

申请人： MEDIATEK INC.

发明人： Jing-Hui Zhuang ,  Ying-Chou Shih ,  Sheng-Wei Lei ,  Chang-Lin Wei ,  Chih-Yang Liu ,  Che-Hsien Huang ,  Yi-Chieh Lin

IPC分类号： G01R31/28 ,  G01R31/66 ,  G01R31/26

CPC分类号： G01R31/2886 ,  G01R31/26 ,  G01R31/66 ,  G01R31/2893

摘要： A test kit for testing a device under test (DUT) includes a socket structure for containing the DUT, and a plunger assembly detachably coupled with the socket structure. The plunger assembly includes a multi-layered structure having at least an interposer substrate sandwiched by a top socket and a nest.

公开(公告)号：US20240003963A1

公开(公告)日：2024-01-04

申请号：US18071611

申请日：2022-11-29

申请人： Kingston Digital, Inc.

发明人： Chao-Kun LEE ,  Chih-Hsiang HSIAO ,  Cheng-En YU

IPC分类号： G01R31/28

CPC分类号： G01R31/2834 ,  G01R31/2893

摘要： In an automatic test system, a test computer of a kind of test equipment communicates with a loading-and-unloading computer of a kind of loading-and-unloading equipment. The loading-and-unloading equipment automatically loads a plurality of target devices on a plurality of test carriers according to the state of the test equipment, and the test equipment automatically tests the target devices loaded on the test carriers according to the state of the loading-and-unloading equipment. In addition, after the test is completed, the loading-and-unloading equipment automatically unloads the tested target devices from the test carriers, and automatically sorts the tested target devices according to the test results generated by the test equipment.

公开(公告)号：US20230417796A1

公开(公告)日：2023-12-28

申请号：US17850858

申请日：2022-06-27

申请人： Western Digital Technologies, Inc.

发明人： Yalaj Goyal ,  Shailesh R. Nayak ,  Joe Paul Moolanmoozha

IPC分类号： G01R1/04 ,  G01R31/28

CPC分类号： G01R1/0466 ,  G01R31/2893

摘要： An integrated circuit (IC) device test socket has an integrally formed IC picking mechanism for removing an IC device from the test socket after testing. The test socket has a base member and a cover member. The base member includes a recess that is configured to receive an IC device for testing. The cover member is configured to removably engage the base member to secure the IC device between the cover member and the base member. The cover member includes an IC picking mechanism configured to use suction to retain the IC device to the cover member.

公开(公告)号：US11809552B2

公开(公告)日：2023-11-07

申请号：US17222596

申请日：2021-04-05

申请人： Power Fingerprinting Inc.

发明人： Carlos R. Aguayo Gonzalez ,  Jeffrey H. Reed ,  Steven C. Chen

IPC分类号： G06F21/55 ,  G01R22/00 ,  G06F21/32 ,  G06F21/75 ,  G01R1/04 ,  G01R31/28 ,  G01R21/00

CPC分类号： G06F21/552 ,  G01R21/00 ,  G01R31/2832 ,  G01R31/2887 ,  G01R31/2891 ,  G01R31/2893 ,  G06F21/32 ,  G06F21/755 ,  G01R1/0408 ,  G01R31/2886 ,  G06F2221/034

摘要： Some embodiments described herein include a system that collects and learns reference side-channel normal activity, process it to reveal key features, compares subsequent collected data and processed data for anomalous behavior, and reports such behavior to a management center where this information is displayed and predefine actions can be executed when anomalous behavior is observed. In some instances, a physical side channel (e.g. and indirect measure of program execution such as power consumption or electromagnetic emissions and other physical signals) can be used to assess the execution status in a processor or digital circuit using an external monitor and detect, with extreme accuracy, when an unauthorized execution has managed to disrupt the normal operation of a target system (e.g., a computer system, etc.).

公开(公告)号：US11802906B2

公开(公告)日：2023-10-31

申请号：US17438876

申请日：2020-04-08

申请人： ATECO INC.

发明人： Taek Seon Lee

IPC分类号： G01R31/28 ,  G01R1/02 ,  G01R1/067 ,  G01R1/04 ,  G01R1/073 ,  G01B11/06

CPC分类号： G01R31/2867 ,  G01R31/2893 ,  G01B11/0608

摘要： The present invention relates to a test handler having a hand teaching function and a hand teaching method using same, the test handler comprising: a plurality of sites where devices are picked up or placed; reference points disposed adjacent to the plurality of sites, respectively; and a hand configured to transfer a device and including a sensor unit configured to calculate the position of a reference point in a non-contact manner. By the electronic component test handler having a hand teaching function and the hand teaching method using same, according to the present invention, an error which may occur due to repeated use or a position error required to be corrected according to exchange of kits can be automatically corrected using a reference groove, so that a separate work for position correction is not required and thus convenience and efficiency can be improved.

公开(公告)号：US20230341462A1

公开(公告)日：2023-10-26

申请号：US18194138

申请日：2023-03-31

申请人： ADVANTEST Corporation

发明人： Akihisa Suda ,  Yoshitaka Takeuchi ,  Takuro Kajihara

IPC分类号： G01R31/28

CPC分类号： G01R31/2893 ,  G01R31/2867

摘要： An electronic component handling apparatus includes: a pressing device that presses a device under test (DUT) or a carrier containing the DUT against a socket while a test tray having an insert containing the DUT or the carrier is in a vertical state. The pressing device includes: a pusher that contacts the DUT or the carrier; and an abutting part that abuts the insert.

公开(公告)号：US20230170236A1

公开(公告)日：2023-06-01

申请号：US17993369

申请日：2022-11-23

申请人： STMicroelectronics (Malta) Ltd

发明人： Silvio SPITERI ,  Tiziana BORG ,  Alex GRIMA

IPC分类号： H01L21/673 ,  G01R31/28 ,  H01L21/677

CPC分类号： H01L21/67333 ,  G01R31/2893 ,  H01L21/67712

摘要： A tray carrier includes a base plate having a first and second pairs of opposed sides as well as opposed first and second surfaces. Channel-shaped corner members provide containment formations for trays stacked at the first surface of the base plate. Tray carrier gripping cavities provided in the first pair of opposed sides can be engaged by gripping formations of an automated gripper to facilitate gripping the tray carrier. Raised portions at the first surface of the base plate provide a tray-gripping space engaged by gripping formations of the automated gripper to facilitate gripping trays stacked at the first surface of the base plate. Handle members at the second sides of the base plate facilitate manual handling of the tray carrier, and a pair of opposed recesses in the first sides of the base plate provide a narrowed intermediate portion of the base plate for manual handling of trays.