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公开(公告)号：US5157668A
公开(公告)日：1992-10-20
申请号：US375839
申请日：1989-07-05
CPC分类号： G06F11/2257 , G01R31/2846 , G06F17/5022
摘要： An artificial intelligence based method and apparatus for locating faults in electronic units includes a technique for modelling electronic units in terms of behavioral constraints. Behavioral constraints model circuit components in terms of changes in outputs thereof which result from changes in inputs thereto. These changes, referred to as "phase changes" may be supplemented by gain and compliance constraints to model an electronic unit at all functional abstraction or hierarchical decomposition levels thereof. In addition to providing a universal modelling scheme, behavioral constraint relationships provide a highly accurate indication of subtle changes in a circuit, for accurate fault location or troubleshooting.Troubleshooting takes place by applying a predetermined search strategy on the electronic unit which is represented by behavioral constraints. The search strategy begins with a top down search. When a faulty block is found, the search moves down one functional abstraction level and searches the next lower level block having an output corresponding to the output of the higher level block. If the next lower level block is not defective, adjacent blocks at the next lower level are searched.Testing of the electronic unit is begun according to the functional test plan specified for the unit. Each functional test in the functional test plan is associated with one or more blocks at a functional abstraction level. When a functional test fails, troubleshooting begins at the block and functional abstraction level corresponding to the failed functional test.
摘要翻译： 用于定位电子单元中的故障的基于人工智能的方法和装置包括在行为约束方面对电子单元进行建模的技术。 根据其输入变化而导致的输出变化的行为约束模型电路组件。 被称为“相位变化”的这些变化可以通过增益和合规约束来补充，以在所有功能抽象或其分级分解级别对电子单元建模。 除了提供通用建模方案之外，行为约束关系提供了电路中微妙变化的高精度指示，用于准确的故障定位或故障排除。 通过在由行为约束表示的电子单元上应用预定的搜索策略来进行故障排除。 搜索策略以自上而下的搜索开始。 当找到有故障的块时，搜索向下移动一个功能抽象级别，并搜索具有对应于较高级别块的输出的输出的下一个较低级别块。 如果下一个较低级别的块没有缺陷，则搜索下一个较低级别的相邻块。 电子单元的测试根据本机规定的功能测试计划开始。 功能测试计划中的每个功能测试与功能抽象级别的一个或多个块相关联。 当功能测试失败时，故障排除从对应于故障功能测试的块和功能抽象级别开始。
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2.发明授权Method, apparatus and film strip of particular design for rapid test of a film processor 失效特殊设计的方法，装置和胶片条，用于快速测试胶片处理器
公开(公告)号：US4365895A
公开(公告)日：1982-12-28
申请号：US212742
申请日：1980-12-03
CPC分类号： G01N21/86 , G03D13/007
摘要： Apparatus and method for evaluation of a film processor, particularly an x-ray film processor, based on a photodetector signal sequentially indicating the optical density of graded density test areas on a developed film and comparing the output thereof to a preselected voltage relating to the acceptable/too dark threshold of an unexposed or base fog area, the acceptable or too light threshold of a maximum density or dark area and the acceptable/too light and acceptable/too dark threshold of a medium density test area. Sequence testing of the graded density areas is functionally related on a single film strip to timing marks, adapted to be read by photodetector and timing circuitry, the timing marks and graded density test areas being linearly spaced and relatively disposed along the length of film strip.
摘要翻译： 基于光电检测器信号来评估胶片处理器，特别是X射线胶片处理器的装置和方法，该信号顺序地指示显影胶片上的梯度密度测试区域的光密度，并将其输出与可接受的预定电压进行比较 未曝光或基雾区域的太暗阈值，最大密度或暗区域的可接受或太轻的阈值以及中密度测试区域的可接受/太亮和可接受/太暗的阈值。 分级密度区域的序列测试功能上与单个胶片条到定时标记有关，适合于由光电检测器和定时电路读取，定时标记和分级密度测试区域沿着胶片条的长度线性间隔并相对设置。
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公开(公告)号：US4508686A
公开(公告)日：1985-04-02
申请号：US379981
申请日：1982-05-19
CPC分类号： G03D13/007 , G01N21/86
摘要： Apparatus and test film strip for evaluation of a film processor, particularly an x-ray film processor, based on a photodetector signal sequentially indicating the optical density of graded density test areas on a developed film and comparing the output thereof to a preselected voltage relating to the acceptable/too dark threshold of an unexposed or base fog area, the acceptable or too light threshold of a maximum density or dark area and the acceptable/too light and acceptable/too dark threshold of a medium density test area. Sequence testing of the graded density areas is functionally related on a single film strip to timing marks, adapted to be read by photodetector and timing circuitry, the timing marks and graded density test areas being linearly spaced and relatively disposed along the length of film strip.
摘要翻译： 用于评估胶片处理器，特别是X射线胶片处理器的装置和测试胶片条，其基于依次指示显影胶片上梯度密度测试区域的光密度的光电探测器信号，并将其输出与 未曝光或基雾区域的可接受/太暗的阈值，最大密度或暗区域的可接受或太轻的阈值以及中等密度测试区域的可接受/太亮和可接受/太暗的阈值。 分级密度区域的序列测试功能上与单个胶片条到定时标记有关，适合于由光电检测器和定时电路读取，定时标记和分级密度测试区域沿着胶片条的长度线性间隔并相对设置。
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公开(公告)号：US4042855A
公开(公告)日：1977-08-16
申请号：US586149
申请日：1975-06-12
IPC分类号： H05B41/24 , H02M7/538 , H02M7/5381 , H02M7/5383 , H05B41/282 , H05B41/29
CPC分类号： H02M7/5381 , H02M7/53835 , H05B41/2821
摘要： A high frequency transistor ballast is utilized to drive flourescent lamps. The electrical system of the ballast consists of a central rectifying and control panel and a high frequency inverter. There is also provided a low energy switch in the high frequency inverter system controlling the operation of the high frequency transistor ballast.
摘要翻译： 高频晶体管镇流器用于驱动荧光灯。 镇流器的电气系统由中央整流和控制面板和高频逆变器组成。 在高频逆变器系统中还提供了一个低能量开关来控制高频晶体管镇流器的工作。
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