公开(公告)号：US5157668A

公开(公告)日：1992-10-20

申请号：US375839

申请日：1989-07-05

申请人： Charles W. Buenzli, Jr. ,  Ravi Rastogi ,  Kenneth F. Sierzega ,  Maurice M. Tayeh

发明人： Charles W. Buenzli, Jr. ,  Ravi Rastogi ,  Kenneth F. Sierzega ,  Maurice M. Tayeh

IPC分类号： G01R31/28 ,  G06F11/25 ,  G06F17/50

CPC分类号： G06F11/2257 ,  G01R31/2846 ,  G06F17/5022

摘要： An artificial intelligence based method and apparatus for locating faults in electronic units includes a technique for modelling electronic units in terms of behavioral constraints. Behavioral constraints model circuit components in terms of changes in outputs thereof which result from changes in inputs thereto. These changes, referred to as "phase changes" may be supplemented by gain and compliance constraints to model an electronic unit at all functional abstraction or hierarchical decomposition levels thereof. In addition to providing a universal modelling scheme, behavioral constraint relationships provide a highly accurate indication of subtle changes in a circuit, for accurate fault location or troubleshooting.Troubleshooting takes place by applying a predetermined search strategy on the electronic unit which is represented by behavioral constraints. The search strategy begins with a top down search. When a faulty block is found, the search moves down one functional abstraction level and searches the next lower level block having an output corresponding to the output of the higher level block. If the next lower level block is not defective, adjacent blocks at the next lower level are searched.Testing of the electronic unit is begun according to the functional test plan specified for the unit. Each functional test in the functional test plan is associated with one or more blocks at a functional abstraction level. When a functional test fails, troubleshooting begins at the block and functional abstraction level corresponding to the failed functional test.

摘要翻译： 用于定位电子单元中的故障的基于人工智能的方法和装置包括在行为约束方面对电子单元进行建模的技术。 根据其输入变化而导致的输出变化的行为约束模型电路组件。 被称为“相位变化”的这些变化可以通过增益和合规约束来补充，以在所有功能抽象或其分级分解级别对电子单元建模。 除了提供通用建模方案之外，行为约束关系提供了电路中微妙变化的高精度指示，用于准确的故障定位或故障排除。 通过在由行为约束表示的电子单元上应用预定的搜索策略来进行故障排除。 搜索策略以自上而下的搜索开始。 当找到有故障的块时，搜索向下移动一个功能抽象级别，并搜索具有对应于较高级别块的输出的输出的下一个较低级别块。 如果下一个较低级别的块没有缺陷，则搜索下一个较低级别的相邻块。 电子单元的测试根据本机规定的功能测试计划开始。 功能测试计划中的每个功能测试与功能抽象级别的一个或多个块相关联。 当功能测试失败时，故障排除从对应于故障功能测试的块和功能抽象级别开始。