Method of utilizing fabrication process of poly-Si spacer to build flash memory with 2bit/cell
    1.
    发明授权
    Method of utilizing fabrication process of poly-Si spacer to build flash memory with 2bit/cell 有权
    利用多硅衬垫制造工艺构建2bit / cell的闪速存储器的方法

    公开(公告)号:US06723603B2

    公开(公告)日:2004-04-20

    申请号:US10183530

    申请日:2002-06-28

    IPC分类号: H01L21336

    摘要: The present invention provides a method utilizing the fabrication process of poly-Si spacers to build a flash memory with 2bit/cell. In the present invention, recessed poly-Si spacers are used to fabricate discontinuous floating gates below a control gate to build a flash memory with 2bit/cell. The present invention is characterized in that the fabrication process of poly-Si spacers is exploited to complete the fabrication process of floating gates in automatic alignment way without any extra mask process. Moreover, each memory cell in this flash memory can store two bits, hence increasing the memory capacity.

    摘要翻译: 本发明提供了利用多晶硅间隔物的制造工艺来构建具有2bit / cell的闪速存储器的方法。 在本发明中,凹入的多晶硅间隔物用于制造控制栅极下面的不连续的浮动栅极以构建具有2bit / cell的闪速存储器。 本发明的特征在于,多晶硅间隔物的制造工艺被利用以完全以自动对准方式完成浮栅的制造工艺,而无需任何额外的掩模工艺。 此外,该闪速存储器中的每个存储单元可以存储两个位,从而增加存储器容量。