APPARATUS AND METHODS FOR DYNAMIC PASSIVE INTERMODULATION DISTORTION TESTING

    公开(公告)号:US20170122990A1

    公开(公告)日:2017-05-04

    申请号:US15335733

    申请日:2016-10-27

    CPC classification number: G01R23/20 G01N3/34 G01R31/2853

    Abstract: A passive intermodulation (“PIM”) distortion test apparatus includes a housing, hammering elements disposed within the housing, each hammering element including a moveable striking member, a strike plate positioned above the hammering elements, where a bottom surface of the strike plate is positioned at a distance above the hammering elements such that the moveable striking members of the hammering elements impact the strike plate when moved into their activated positions, and a retaining member that is configured to hold a device under test on a top surface of the strike plate while a PIM distortion test is performed on the device under test.

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