公开(公告)号：US09596027B2

公开(公告)日：2017-03-14

申请号：US14268144

申请日：2014-05-02

Applicant: EXFO Inc.

Inventor： Gang He ,  Daniel Gariepy ,  Mats Skold

IPC: H04B10/079 ,  H04J14/06

CPC classification number: H04B10/07953 ,  H04J14/06

Abstract: There is provided a method and an apparatus for determining quality parameters on a polarization-multiplexed optical signal based on an analysis of the power spectral density of the Signal-Under-Test (SUT). The method is predicated upon knowledge of the spectral shape of the signal in the absence of significant noise or spectral deformation. This knowledge is provided by a reference optical spectrum trace. Based on this knowledge and under the assumption that ASE noise level is approximately constant in wavelength over a given spectral range, the spectral deformation of the signal contribution of the SUT may be estimated using a comparison of the spectral variations of the optical spectrum trace of the SUT with that of the reference optical spectrum trace.

Abstract translation: 提供了一种基于对测试信号（SUT）的功率谱密度的分析来确定偏振复用光信号质量参数的方法和装置。 该方法基于在没有显着噪声或光谱变形的情况下对信号的光谱形状的了解。 该知识由参考光谱轨迹提供。 基于这一知识，并假设ASE噪声水平在给定光谱范围内的波长近似恒定，则SUT的信号贡献的光谱变形可以使用光谱轨迹的光谱变化的比较来估计 SUT与参考光谱图谱相同。

公开(公告)号：US09673899B2

公开(公告)日：2017-06-06

申请号：US14223165

申请日：2014-03-24

Applicant: EXFO INC.

Inventor： Henrik Sunnerud ,  Mats Skold ,  Mathias Westlund

IPC: H04J14/06 ,  H04B10/079

CPC classification number: H04B10/07953 ,  H04J14/06

Abstract: There is provided a system and a method for determining an in-band noise parameter representative of the optical noise contribution (such as OSNR) on a polarization-multiplexed optical Signal-Under-Test (SUT) comprising two polarized phase-modulated data-carrying contributions and an optical noise contribution. For each of a multiplicity of distinct polarization-analyzer conditions, the SUT is analyzed to provide at least one polarization-analyzed component of the SUT and the polarization-analyzed component is detected with an electronic bandwidth at least ten times smaller than the symbol rate of the SUT to obtain a corresponding acquired electrical signal; for each acquired electrical signal, a value of a statistical parameter is determined from the ac component of the acquired electrical signal, thereby providing a set of statistical-parameter values corresponding to the multiplicity of distinct polarization-analyzer conditions; and, from the set of statistical-parameter values, the in-band noise parameter is mathematically determined.

公开(公告)号：US20150110486A1

公开(公告)日：2015-04-23

申请号：US14223165

申请日：2014-03-24

Applicant: EXFO INC.

Inventor： Henrik Sunnerud ,  Mats Skold ,  Mathias Westlund

IPC: H04B10/079 ,  H04J14/06

CPC classification number: H04B10/07953 ,  H04J14/06

Abstract: There is provided a system and a method for determining an in-band noise parameter representative of the optical noise contribution (such as OSNR) on a polarization-multiplexed optical Signal-Under-Test (SUT) comprising two polarized phase-modulated data-carrying contributions and an optical noise contribution. For each of a multiplicity of distinct polarization-analyzer conditions, the SUT is analyzed to provide at least one polarization-analyzed component of the SUT and the polarization-analyzed component is detected with an electronic bandwidth at least ten times smaller than the symbol rate of the SUT to obtain a corresponding acquired electrical signal; for each acquired electrical signal, a value of a statistical parameter is determined from the ac component of the acquired electrical signal, thereby providing a set of statistical-parameter values corresponding to the multiplicity of distinct polarization-analyzer conditions; and, from the set of statistical-parameter values, the in-band noise parameter is mathematically determined.

Abstract translation: 提供了一种系统和方法，用于在偏振复用光信号不足测试（SUT）上确定表示光噪声贡献（例如OSNR）的带内噪声参数的系统和方法，该信号包括两个偏振相位调制数据携带 贡献和光学噪声贡献。 对于多个不同的偏振分析器条件中的每一个，分析SUT以提供至少一个SUT的偏振分析分量，并且以电子带宽检测偏振分析的分量，比电子带宽小至少比符号率 SUT获得相应的获取的电信号; 对于每个获取的电信号，从所获取的电信号的ac分量确定统计参数的值，从而提供与多个不同偏振分析器条件对应的一组统计参数值; 并且从该组统计参数值中，数学地确定带内噪声参数。