公开(公告)号：US12055506B2

公开(公告)日：2024-08-06

申请号：US17632043

申请日：2020-05-28

Applicant: Foss Analytical A/S

Inventor： Per Waaben Hansen ,  Mads Lykke Andersen

IPC: G01N27/06 ,  G01N21/3577 ,  G01N33/04

CPC classification number: G01N27/06 ,  G01N21/3577 ,  G01N33/04

Abstract: A method of standardizing an output of an electrical property sensor includes calculating a reference magnitude (Condr) of an electrical property of an electrically conductive liquid, based on obtaining, by a spectrometer, spectral data resulting from an interaction of light with the electrically conductive liquid, and applying, in a data processor, a mathematical model to the spectral data to calculate the reference magnitude (Condr) of the electrical property, wherein the mathematical model links the spectral data to magnitudes of the electrical property; comparing, in the data processor, a measured magnitude (Condm) of the electrical property of the electrically conductive liquid with a reference magnitude (Condr) of the electrical property, wherein the measured magnitude (Condm) of the electrical property is obtained with the electrical property sensor; determining, in the data processor, a standardization factor (F) dependent on a ratio of the reference magnitude (Condr) and the measured magnitude (Condm).

公开(公告)号：US10365159B2

公开(公告)日：2019-07-30

申请号：US15539217

申请日：2015-02-02

Applicant: Foss Analytical A/S

Inventor： Steen Kjaer Andersen ,  Mads Lykke Andersen

IPC: G01J3/453 ,  G01J3/45 ,  G01J3/06

Abstract: A spectrometer system comprises a scanning interferometer; a drive system mechanically coupled to a movable reflector element of the scanning interferometer and operable to effect reciprocation of the movable reflector element at a plurality, preferably more than two, for example three, different scan speeds; a detector arrangement configured to sample at equidistant time intervals an interferogram formed by the scanning interferometer to generate a sampled interferogram; and a data processor is adapted to acquire a sampled interferogram at each of the plurality of different scan speeds and to perform a relative comparison of the content of the so acquired plurality of sampled interferograms.