公开(公告)号：US20140249055A1

公开(公告)日：2014-09-04

申请号：US14342811

申请日：2012-09-28

Applicant: GENERAL ELECTRIC COMPANY

Inventor： Masako Yamada ,  Sandip Maity ,  Sameer Dikar Vartak ,  Rajesh Langoju ,  Abhijit Patil

IPC: G01J3/28 ,  G01N21/55

CPC classification number: G01J3/2823 ,  G01N21/253 ,  G01N21/45 ,  G01N21/55 ,  G01N21/553 ,  G01N21/554

Abstract: A system for detecting an array of samples having detectable samples and at least one reference sample is provided. The system comprises an electromagnetic radiation source, a sensing surface comprising a plurality of sample fields, wherein the plurality of sample fields comprise at least one reference field, a phase difference generator configured to introduce differences in pathlengths of one or more samples in the array of samples, and an imaging spectrometer configured to image one or more samples in the array of samples.

Abstract translation: 提供了一种用于检测具有可检测样品和至少一个参考样品的样品阵列的系统。 所述系统包括电磁辐射源，感测表面包括多个采样场，其中所述多个采样场包括至少一个参考场，相位差发生器被配置为引入所述阵列中的一个或多个采样的路径长度差 样品和成像光谱仪，其被配置成对样品阵列中的一个或多个样品进行成像。

公开(公告)号：US10481002B2

公开(公告)日：2019-11-19

申请号：US14342811

申请日：2012-09-28

Applicant: GENERAL ELECTRIC COMPANY

Inventor： Masako Yamada ,  Sandip Maity ,  Sameer Dinkar Vartak ,  Rajesh Langoju ,  Abhijit Patil

IPC: G01N21/45 ,  G01J3/28 ,  G01N21/25 ,  G01N21/55 ,  G01N21/552

Abstract: A system for detecting an array of samples having detectable samples and at least one reference sample is provided. The system comprises an electromagnetic radiation source, a sensing surface comprising a plurality of sample fields, wherein the plurality of sample fields comprise at least one reference field, a phase difference generator configured to introduce differences in pathlengths of one or more samples in the array of samples, and an imaging spectrometer configured to image one or more samples in the array of samples.