公开(公告)号：US11507616B2

公开(公告)日：2022-11-22

申请号：US17011912

申请日：2020-09-03

Applicant: General Electric Company

Inventor： Shaopeng Liu ,  Xiao Bian ,  Yan Liu ,  Feng Xue ,  Walter Vincent Dixon, III ,  Mark Richard Gilder ,  Peihong Zhu ,  Bernard Patrick Bewlay ,  Byron Andrew Pritchard ,  Masako Yamada ,  Colin James Parris

IPC: G06F16/583 ,  G06N3/04 ,  G06F16/14 ,  G06F16/51

Abstract: A method of inspecting a component includes storing at least one inspection image file in a memory and receiving a search request associated with the at least one inspection image file. The method also includes accessing a database including a plurality of image files, comparing the hash code of the at least one inspection image file to the hash code of each image file of the plurality of image files, and identifying a first subset of image files based on the hash code comparison. The method also includes comparing the feature data of the at least one inspection image file to the feature data of each image file of the first subset of image files and classifying a second subset of image files as relevant based on the feature data comparison. The method further includes generating search results based on the second subset of image files.

公开(公告)号：US20220067083A1

公开(公告)日：2022-03-03

申请号：US17011912

申请日：2020-09-03

Applicant: General Electric Company

Inventor： Shaopeng Liu ,  Xiao Bian ,  Yan Liu ,  Feng Xue ,  Walter Vincent Dixon, III ,  Mark Richard Gilder ,  Peihong Zhu ,  Bernard Patrick Bewlay ,  Byron Andrew Pritchard ,  Masako Yamada ,  Colin James Parris

IPC: G06F16/583 ,  G06F16/51 ,  G06F16/14 ,  G06N3/04

Abstract: A method of inspecting a component includes storing at least one inspection image file in a memory and receiving a search request associated with the at least one inspection image file. The method also includes accessing a database including a plurality of image files, comparing the hash code of the at least one inspection image file to the hash code of each image file of the plurality of image files, and identifying a first subset of image files based on the hash code comparison. The method also includes comparing the feature data of the at least one inspection image file to the feature data of each image file of the first subset of image files and classifying a second subset of image files as relevant based on the feature data comparison. The method further includes generating search results based on the second subset of image files.

公开(公告)号：US20140249055A1

公开(公告)日：2014-09-04

申请号：US14342811

申请日：2012-09-28

Applicant: GENERAL ELECTRIC COMPANY

Inventor： Masako Yamada ,  Sandip Maity ,  Sameer Dikar Vartak ,  Rajesh Langoju ,  Abhijit Patil

IPC: G01J3/28 ,  G01N21/55

CPC classification number: G01J3/2823 ,  G01N21/253 ,  G01N21/45 ,  G01N21/55 ,  G01N21/553 ,  G01N21/554

Abstract: A system for detecting an array of samples having detectable samples and at least one reference sample is provided. The system comprises an electromagnetic radiation source, a sensing surface comprising a plurality of sample fields, wherein the plurality of sample fields comprise at least one reference field, a phase difference generator configured to introduce differences in pathlengths of one or more samples in the array of samples, and an imaging spectrometer configured to image one or more samples in the array of samples.

Abstract translation: 提供了一种用于检测具有可检测样品和至少一个参考样品的样品阵列的系统。 所述系统包括电磁辐射源，感测表面包括多个采样场，其中所述多个采样场包括至少一个参考场，相位差发生器被配置为引入所述阵列中的一个或多个采样的路径长度差 样品和成像光谱仪，其被配置成对样品阵列中的一个或多个样品进行成像。

公开(公告)号：US11068752B2

公开(公告)日：2021-07-20

申请号：US16670053

申请日：2019-10-31

Applicant: General Electric Company

Inventor： Xiao Bian ,  Colin James Parris ,  Bernard Patrick Bewlay ,  Masako Yamada ,  Shaopeng Liu ,  Peng Chu

IPC: G06K9/62 ,  G06F16/51 ,  G06F16/55

Abstract: A method of inspecting a component using an image inspection controller that includes a processor communicatively coupled to a memory includes classifying each sample image in a first database as a first sample or a second sample using a classification module, extracting at least one class generic feature from each first sample to generate a plurality of class generic features, and extracting at least one class specific feature from each second sample to generate a plurality of class specific features. The method further includes combining the class generic features and the class specific features to generate a plurality of supplemental images. The method further includes storing the sample images and the supplemental images in a second database, classifying each sample image and each supplemental image, capturing at least one image of the component using a camera, and identifying at least one feature of the component in the at least one image of the component using the classification module.

公开(公告)号：US20170151736A1

公开(公告)日：2017-06-01

申请号：US14955632

申请日：2015-12-01

Applicant: General Electric Company

Inventor： Mark Marshall Meyers ,  Masako Yamada ,  Paul Richard Myers ,  Scott Michael Miller ,  Siavash Yazdanfar

IPC: B29D11/00 ,  F21V8/00 ,  B29C45/14

CPC classification number: B29D11/00663 ,  B29C33/306 ,  B29C33/424 ,  B29C45/2673 ,  B29C45/372 ,  B29L2011/00 ,  G02B6/0038 ,  G02B6/0058 ,  G02B6/0061 ,  G02B6/0063 ,  G02B6/0065 ,  G02B6/0095

Abstract: A modular method of manufacturing a waveguide is disclosed. The method includes positioning a mold insert including a plurality of mold prototypes, along at least one side wall of a molding equipment such that micro-optic structures of each mold prototype in the plurality of mold prototypes, faces a mold cavity. Each mold prototype extends along a length of the mold insert and the plurality of mold prototypes is disposed adjacent one another along a height of the mold insert. The method further includes feeding a material into the mold cavity for molding the material in the mold cavity to generate waveguide including a major surface having an optical pattern, where the optical pattern includes a plurality of elongated facets. Each of the plurality of elongated facets extends into the major surface and along a length of the waveguide. Further, the optical pattern extends along a height of the waveguide.

公开(公告)号：US20160363711A1

公开(公告)日：2016-12-15

申请号：US14736081

申请日：2015-06-10

Applicant: GENERAL ELECTRIC COMPANY

Inventor： Mark Marshall Meyers ,  Paul Richard Myers ,  Masako Yamada ,  Scott Michael Miller ,  Siavash Yazdanfar

IPC: F21V8/00 ,  F21K99/00

CPC classification number: G02B6/0038 ,  F21K9/20 ,  F21K9/61 ,  F21S8/04 ,  F21S8/043 ,  F21V23/003 ,  F21V23/02 ,  F21Y2103/10 ,  F21Y2115/10 ,  F21Y2115/15 ,  G02B6/0036 ,  G02B6/0063

Abstract: Waveguides having improved illumination distribution and output luminance variation and lighting systems utilizing such waveguides are disclosed. The lighting systems generally include a light source which is optically coupled to a waveguide to distribute the light. The waveguides include one or more headlighting reduction regions and one or more output intensity shaping regions that work together to improve the distribution of light and reduce the effects of headlighting. The headlighting reduction regions may be integrated with the output intensity shaping region or may be an independent section.

Abstract translation: 公开了具有改进的照明分布和输出亮度变化的波导以及利用这种波导的照明系统。 照明系统通常包括光源，其光耦合到波导以分布光。 波导包括一个或多个前照光减小区域和一个或多个输出强度成形区域，其一起工作以改善光的分布并减少头灯的影响。 前照灯降低区域可以与输出强度整形区域集成，或者可以是独立的部分。

公开(公告)号：US20210133511A1

公开(公告)日：2021-05-06

申请号：US16670053

申请日：2019-10-31

Applicant: General Electric Company

Inventor： Xiao Bian ,  Colin James Parris ,  Bernard Patrick Bewlay ,  Masako Yamada ,  Shaopeng Liu ,  Peng Chu

IPC: G06K9/62 ,  G06F16/55 ,  G06F16/51

Abstract: A method of inspecting a component using an image inspection controller that includes a processor communicatively coupled to a memory includes classifying each sample image in a first database as a first sample or a second sample using a classification module, extracting at least one class generic feature from each first sample to generate a plurality of class generic features, and extracting at least one class specific feature from each second sample to generate a plurality of class specific features. The method further includes combining the class generic features and the class specific features to generate a plurality of supplemental images. The method further includes storing the sample images and the supplemental images in a second database, classifying each sample image and each supplemental image, capturing at least one image of the component using a camera, and identifying at least one feature of the component in the at least one image of the component using the classification module.

公开(公告)号：US10481002B2

公开(公告)日：2019-11-19

申请号：US14342811

申请日：2012-09-28

Applicant: GENERAL ELECTRIC COMPANY

Inventor： Masako Yamada ,  Sandip Maity ,  Sameer Dinkar Vartak ,  Rajesh Langoju ,  Abhijit Patil

IPC: G01N21/45 ,  G01J3/28 ,  G01N21/25 ,  G01N21/55 ,  G01N21/552

Abstract: A system for detecting an array of samples having detectable samples and at least one reference sample is provided. The system comprises an electromagnetic radiation source, a sensing surface comprising a plurality of sample fields, wherein the plurality of sample fields comprise at least one reference field, a phase difference generator configured to introduce differences in pathlengths of one or more samples in the array of samples, and an imaging spectrometer configured to image one or more samples in the array of samples.