公开(公告)号：US11205701B1

公开(公告)日：2021-12-21

申请号：US16899086

申请日：2020-06-11

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Henry Aldridge ,  John J. Ellis-Monaghan ,  Michel J. Abou-Khalil

IPC: H01L29/10 ,  H01L29/08 ,  H01L27/092 ,  H01L21/8238

Abstract: Structures for a field-effect transistor and methods of forming a structure for a field-effect transistor. A gate structure is formed over a channel region of a substrate. A first source/drain region is positioned in the substrate adjacent to a first sidewall of the gate structure, a second source/drain region is positioned in the substrate adjacent to a second sidewall of the gate structure, and an extension region is positioned in the substrate. The extension region includes first and second sections that each overlap with the first source/drain region. The first and second sections of the extension region are spaced apart along a longitudinal axis of the gate structure. A portion of the channel region is positioned along the longitudinal axis of the gate structure between the first and second sections of the extension region.

公开(公告)号：US20210391425A1

公开(公告)日：2021-12-16

申请号：US16899086

申请日：2020-06-11

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Henry Aldridge ,  John J. Ellis-Monaghan ,  Michel J. Abou-Khalil

IPC: H01L29/10 ,  H01L29/08 ,  H01L21/8238 ,  H01L27/092

Abstract: Structures for a field-effect transistor and methods of forming a structure for a field-effect transistor. A gate structure is formed over a channel region of a substrate. A first source/drain region is positioned in the substrate adjacent to a first sidewall of the gate structure, a second source/drain region is positioned in the substrate adjacent to a second sidewall of the gate structure, and an extension region is positioned in the substrate. The extension region includes first and second sections that each overlap with the first source/drain region. The first and second sections of the extension region are spaced apart along a longitudinal axis of the gate structure. A portion of the channel region is positioned along the longitudinal axis of the gate structure between the first and second sections of the extension region.