Process for identifying polycrystalline materials by electron diffraction
    1.
    发明授权
    Process for identifying polycrystalline materials by electron diffraction 失效
    通过电子衍射识别多晶材料的方法

    公开(公告)号:US07532985B2

    公开(公告)日:2009-05-12

    申请号:US10301298

    申请日:2002-11-21

    CPC classification number: G06F19/707 G06F19/703 G06F19/709

    Abstract: A relational database is built and used for the identification of polycrystalline solids by electron diffraction. Selected area electron diffraction (SAED) patterns (rings) produced in an electron diffractometer or a transmission electron microscope (TEM) are matched against database patterns calculated from reduced unit cells of known materials. The effects of double diffraction on electron diffraction patterns are fully incorporated into the database.

    Abstract translation: 建立了关系数据库,用于通过电子衍射识别多晶固体。 在电子衍射仪或透射电子显微镜(TEM)中制备的选定区域电子衍射(SAED)图案(环)与从已知材料的还原单位晶胞计算的数据库图案相匹配。 双衍射对电子衍射图案的影响被完全并入数据库。

    Process for identifying single crystals by electron diffraction
    2.
    发明授权
    Process for identifying single crystals by electron diffraction 失效
    通过电子衍射识别单晶的方法

    公开(公告)号:US06732054B2

    公开(公告)日:2004-05-04

    申请号:US10301326

    申请日:2002-11-21

    CPC classification number: G01N23/207

    Abstract: A relational database is built and used for the identification of single crystals by electron diffraction. Selected area electron diffraction (SAED) patterns (a lattice net of spots) produced in an electron diffractometer or a transmission electron microscope (TEM) are matched against database patterns calculated from reduced unit cells of known materials. The effects of double diffraction on electron diffraction patterns are fully incorporated into the database by rigorous calculation.

    Abstract translation: 建立了关系数据库,用于通过电子衍射识别单晶。 在电子衍射仪或透射电子显微镜(TEM)中产生的选定区域电子衍射(SAED)图案(斑点的网格网)与从已知材料的还原单位晶胞计算的数据库图案相匹配。 通过严格的计算将双衍射对电子衍射图的影响完全并入数据库。

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