公开(公告)号：US08014969B2

公开(公告)日：2011-09-06

申请号：US11964719

申请日：2007-12-27

申请人： Hirokatsu Niijima ,  Koji Hara ,  Noriyoshi Kozuka ,  Kohei Shibata ,  Tetsuya Sakaniwa

发明人： Hirokatsu Niijima ,  Koji Hara ,  Noriyoshi Kozuka ,  Kohei Shibata ,  Tetsuya Sakaniwa

IPC分类号： G01D3/00

CPC分类号： G01R31/31928 ,  G01R31/31917 ,  G11C29/56 ,  G11C2029/5602

摘要： There is provided a test apparatus for testing a plurality of devices under test. The test apparatus includes a signal input section that applies a test signal to the devices under test so as to cause the devices under test to concurrently output response signals, a combining section that generates a single combination signal by using the response signals output from the devices under test, and a judging section that judges whether the devices under test operate normally with reference to the combination signal.

摘要翻译： 提供了一种用于测试多个待测设备的测试装置。 该测试装置包括信号输入部分，该信号输入部分向被测器件施加测试信号，以使被测器件同时输出响应信号;组合部分，通过使用从器件输出的响应信号产生单个组合信号 以及判定部，判断被测设备是否参照组合信号正常工作。

公开(公告)号：US08516430B2

公开(公告)日：2013-08-20

申请号：US12687086

申请日：2010-01-13

申请人： Noriyoshi Kozuka

发明人： Noriyoshi Kozuka

IPC分类号： G06F17/50

CPC分类号： G01R31/31926 ,  G01R31/31924

摘要： There is provided a test apparatus for testing a device under test, including a plurality of operational units that operate in response to control data supplied thereto to test the device under test, a control section that generates packet data containing the control data and unit selection data indicating which one or more of the plurality of operational units are to be selected, and a plurality of data transfer units that are cascade-connected to each other so that the packet data is transferred from each of the plurality of data transfer units to a data transfer unit of a following stage, where each of the plurality of data transfer units corresponds to one or more of the plurality of operational units. Here, when each of the plurality of data transfer units receives the packet data whose unit selection data indicates that one or more of the operational units corresponding thereto are to be selected, the data transfer unit inputs the control data contained in the packet data into the selected operational units or reads data from the selected operational units.

摘要翻译： 提供了一种用于测试被测设备的测试装置，包括响应于提供给其的控制数据进行操作以测试被测设备的多个操作单元，产生包含控制数据和单元选择数据的分组数据的控制部分 指示要选择多个操作单元中的哪个或多个;以及多个数据传送单元，其彼此级联连接，使得分组数据从多个数据传送单元中的每一个传送到数据 传送单元，其中多个数据传送单元中的每一个对应于多个操作单元中的一个或多个。 这里，当多个数据传送单元中的每一个接收单元选择数据指示要选择与其对应的一个或多个操作单元的分组数据时，数据传送单元将包含在分组数据中的控制数据输入到 选择的操作单元或从所选择的操作单元读取数据。

公开(公告)号：US06417682B1

公开(公告)日：2002-07-09

申请号：US09314887

申请日：1999-05-19

申请人： Toshikazu Suzuki ,  Hiroyuki Nagai ,  Noriyoshi Kozuka ,  Yukio Ishigaki ,  Shigeru Matsumura ,  Takashi Sekizuka ,  Hiroyuki Shiotsuka ,  Hiroyuki Hama ,  Eiichi Sekine

发明人： Toshikazu Suzuki ,  Hiroyuki Nagai ,  Noriyoshi Kozuka ,  Yukio Ishigaki ,  Shigeru Matsumura ,  Takashi Sekizuka ,  Hiroyuki Shiotsuka ,  Hiroyuki Hama ,  Eiichi Sekine

IPC分类号： G01R3102

CPC分类号： G01R31/3191 ,  G01R31/31905 ,  G01R31/31924 ,  G01R35/00

摘要： A calibration method for calibrating a semiconductor testing apparatus before mounting semiconductor devices for performing a testing of electric characteristics thereof, the testing apparatus having a driver which generates and outputs a signal, and a socket with a plurality of terminals for receiving pins and transferring signals therethrough. The calibration method includes mounting a test board having a plurality of pins onto the socket and connecting each of the pins of the test board with a respective terminal of the socket, transferring the signal of the driver to the terminals of the test board, detecting the signal of the driver that has reached the test board, and setting an output timing of the signal of the driver based on the signal detected.

摘要翻译： 一种用于在安装用于执行其电特性的测试的半导体器件之前校准半导体测试装置的校准方法，具有产生和输出信号的驱动器的测试装置以及具有用于接收引脚和传输信号的多个端子的插座 。 校准方法包括将具有多个引脚的测试板安装到插座上，并将测试板的每个引脚与插座的相应端子连接，将驱动器的信号传送到测试板的端子，检测 已经到达测试板的驱动器的信号，以及基于检测到的信号来设置驱动器的信号的输出定时。