公开(公告)号：US20240353347A1

公开(公告)日：2024-10-24

申请号：US18685721

申请日：2022-07-07

Applicant: Hitachi Astemo, Ltd.

Inventor： Shinichi INOUE ,  Takateru SEKI ,  Takamasa IMAIZUMI ,  Hiroyuki HAYASHI

IPC: G01N21/88

CPC classification number: G01N21/8851 ,  G01N2021/8861 ,  G01N2021/887 ,  G01N2021/8874

Abstract: A visual inspection apparatus detects a defect candidate for each of captured images of a crown surface of a piston that are captured at a plurality of posture angles different from one another, locates a three-dimensional position of the defect candidate based on a two-dimensional position of the defect candidate detected from at least one captured image among the captured images captured at the plurality of posture angles, applies a perspective projection transformation on the three-dimensional position of the defect candidate to acquire a two-dimensional position of the defect candidate for each of the captured images captured at the plurality of posture angles, determines a feature amount regarding the defect candidate based on the two-dimensional position of the defect candidate for each of the captured images captured at the plurality of posture angles, and inspects the crown surface of the piston using the feature amount regarding the defect candidate.

公开(公告)号：US20240362771A1

公开(公告)日：2024-10-31

申请号：US18565870

申请日：2022-06-07

Applicant: Hitachi Astemo, Ltd.

Inventor： Hideaki ONOZUKA ,  Shinichi INOUE ,  Takamasa IMAIZUMI ,  Hiroyuki HAYASHI

IPC: G06T7/00

CPC classification number: G06T7/001 ,  G06T2207/20081 ,  G06T2207/20084 ,  G06T2207/20221 ,  G06T2207/30164

Abstract: Provided is a visual inspection device including: an image pickup unit configured to pick up an image of a surface of an object to be inspected; a posture control unit configured to change a posture of the object to be inspected with respect to the image pickup unit; a storage unit having stored therein a learning result obtained by machine learning using a defective product sample image, the defective product sample image being generated by combining a defect portion image prepared in advance with a non-defective product image of the object to be inspected at a combination position obtained by referring to three-dimensional data corresponding to the object to be inspected tilted so as to form a posture angle set in advance; and an inspection unit configured to inspect the surface of the object to be inspected based on a picked-up image picked up at the posture angle by the image pickup unit and on the learning result.