公开(公告)号：US12111267B2

公开(公告)日：2024-10-08

申请号：US18372440

申请日：2023-09-25

Applicant: Getac Holdings Corporation

Inventor： Kun-Yu Tsai

IPC: G01N21/88 ,  G01J3/28 ,  G01N21/01 ,  G01N21/3581 ,  G01N21/952 ,  G01N21/956 ,  G06F17/16 ,  G06F18/214 ,  G06N3/04 ,  G06N3/047 ,  G06N3/063 ,  G06N3/08 ,  G06T7/00 ,  G06T7/11 ,  G06T7/40 ,  G06T7/45 ,  G06T7/586 ,  G06V10/143 ,  G06V10/145 ,  G06V10/22 ,  G06V10/24 ,  G06V10/25 ,  G06V10/60 ,  G06V20/64

CPC classification number: G01N21/8806 ,  G01J3/2823 ,  G01N21/01 ,  G01N21/3581 ,  G01N21/8851 ,  G01N21/952 ,  G01N21/956 ,  G06F17/16 ,  G06F18/2148 ,  G06N3/04 ,  G06N3/047 ,  G06N3/063 ,  G06N3/08 ,  G06T7/0004 ,  G06T7/11 ,  G06T7/40 ,  G06T7/45 ,  G06T7/586 ,  G06T7/97 ,  G06V10/143 ,  G06V10/145 ,  G06V10/22 ,  G06V10/242 ,  G06V10/25 ,  G06V10/60 ,  G06V20/64 ,  G06V20/647 ,  G01N2021/8887 ,  G06T2207/10152 ,  G06T2207/20081 ,  G06T2207/20084

Abstract: A system for detecting a surface type of an object includes a driver component, a driver component, and a plurality of photosensitive elements. The surface of the object is divided along a first direction into a plurality of areas, and the driver component sequentially moves one of the plurality of areas to a detection position. The light source component faces the detection position and provides light of a plurality of spectra that are different from one another to illuminate the detection position. The photosensitive elements face different sections of the area at the detection position, to capture detection images of different sections of the area located at the detection position under the light of each of the spectra. One photosensitive axis of the photosensitive elements is parallel to the normal line while another photosensitive axis of the photosensitive elements is between the normal line and the first direction.

公开(公告)号：US20240310294A1

公开(公告)日：2024-09-19

申请号：US18576046

申请日：2022-06-23

Applicant: SAFRAN

Inventor： Franck MICHAUD

IPC: G01N21/88 ,  G01N21/95

CPC classification number: G01N21/8851 ,  G01N21/8806 ,  G01N21/95 ,  G01N2021/8848 ,  G01N2201/0633

Abstract: A method for inspecting the surface finish of a cast part made of single-crystal metal, the surface of the part potentially containing defects resulting from an inhomogeneity of orientation of at least a crystal lattice of the single-crystal metal, the method including acquiring, using an image-acquiring device, a series of images of the cast part illuminated by a polarized and collimated illuminating device, then analysing the series of images by an image-processing device, each image of the series of images being taken at a different polarization angle.

公开(公告)号：US20240288376A1

公开(公告)日：2024-08-29

申请号：US18023810

申请日：2022-03-01

Applicant: BOE TECHNOLOGY GROUP CO., LTD.

Inventor： Xing Li ,  Ruize Li ,  Hao Tang ,  Ronghua Lan ,  Jiuyang Cheng ,  Meng Guo ,  Zhihui Yang ,  Qing Zhang ,  Xuehui Zhu ,  Quanguo Zhou ,  Lijia Zhou ,  Yong Qiao ,  Zhong Huang ,  Lirong Xu

IPC: G01N21/88 ,  G01N21/89 ,  G01N21/892 ,  G06T7/00 ,  G06T7/13 ,  G06V10/44 ,  H10K71/70

CPC classification number: G01N21/8851 ,  G01N21/892 ,  G06T7/0004 ,  G06T7/13 ,  G06V10/44 ,  G01N2021/8887 ,  G01N2021/891 ,  G01N2201/0438 ,  G01N2201/06146 ,  G06T2207/30108 ,  H10K71/70

Abstract: A curved substrate bubble detection method includes: providing, by a first light source and a second light source, parallel light incident to a to-be-tested substrate in different incident directions; obtaining, by a linear array camera, a first image including image information of a first side edge of the to-be-tested substrate; determining location information of a defect region of the to-be-tested substrate according to the first image, and generating a second image including image information of the defect region; binarizing the second image, and determining that the to-be-tested substrate has a bubble defect if there are at least two bright spots in an obtained binarized image, and a distance between any two first bright spots of at least two first bright spots is less than a first preset value. A curved substrate bubble detection system is also disclosed.

公开(公告)号：US12072300B2

公开(公告)日：2024-08-27

申请号：US18298561

申请日：2023-04-11

Applicant: Ford Global Technologies, LLC

Inventor： Scott Arboleda ,  Francis Maslar ,  Walter LaPlante ,  Paul Christopher Shaw

IPC: G01N21/95 ,  B25J9/16 ,  G01N21/88

CPC classification number: G01N21/9515 ,  B25J9/1679 ,  G01N21/8851 ,  G01N2021/9518

Abstract: A flexible inspection system includes a robot with a plurality of scanners and a robot controller. The robot controller is configured to receive a vehicle inspection protocol (VIP) for a vehicle being assembled on an assembly line. The VIP includes checkpoints to be scanned on the vehicle and the checkpoints correspond to components installed on the vehicle and connections between components installed on the vehicle. The robot controller commands the robot to move the plurality of scanners per the VIP such that the checkpoints are scanned. A characteristic of each checkpoint is recorded and compared to a reference characteristic such that a pass or no-pass determination of each checkpoint is provided. A vehicle inspection report with the pass/no-pass determinations is provided to an operator such that operator inspections and/or repairs of the checkpoints are made.

公开(公告)号：US12072289B2

公开(公告)日：2024-08-27

申请号：US17442158

申请日：2020-01-29

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Tomonori Nakamura

IPC: G01N21/64 ,  G01N21/62 ,  G01N21/63 ,  G01N21/88 ,  G01N21/95 ,  G01N21/01

CPC classification number: G01N21/6456 ,  G01N21/62 ,  G01N21/63 ,  G01N21/64 ,  G01N21/6458 ,  G01N21/6489 ,  G01N21/8806 ,  G01N21/8851 ,  G01N21/9501 ,  G01N21/9505 ,  G01N2021/0112 ,  G01N2021/6421 ,  G01N2021/6463 ,  G01N2021/6484 ,  G01N2021/8845

Abstract: An inspection apparatus is an inspection apparatus for inspecting a sample on which a plurality of light-emitting elements is formed, and includes an excitation light source that generates excitation light to irradiate the sample, a camera that images fluorescence having a wavelength longer than a reference wavelength in fluorescence from the light-emitting elements, and a control apparatus that determines a quality of each of the light-emitting elements based on fluorescence imaged by the camera, in which the reference wavelength is a wavelength obtained by adding a full width at half maximum of a normal fluorescence spectrum of the light-emitting element to a peak wavelength of the normal fluorescence spectrum.

公开(公告)号：US20240280502A1

公开(公告)日：2024-08-22

申请号：US18581794

申请日：2024-02-20

Applicant: Lasertec Corporation

Inventor： Minoru HOSOMI

IPC: G01N21/88

CPC classification number: G01N21/8806 ,  G01N21/8851 ,  G01N2201/06113 ,  G01N2201/0636 ,  G01N2201/12753

Abstract: An optical apparatus according to the present embodiment includes a detector for detecting detection light of illumination light reflected by a sample, an optical system for illuminating the sample with the illumination light and guiding the detection light reflected by the sample to the detector, a displacement measurement unit for measuring a displacement drift indicating the amount of drift in the position of an optical element included in the optical system, a storage unit for storing the correlation between the displacement drift and a focus drift indicating the amount of drift in the distance between the sample and the optical system when the detection light detected by the detector is brought into focus, and a prediction unit for predicting a focus drift from the measured displacement drift by using the correlation.

公开(公告)号：US20240264092A1

公开(公告)日：2024-08-08

申请号：US18105299

申请日：2023-02-03

Applicant: RAYTHEON TECHNOLOGIES CORPORATION

Inventor： Jeremiah C. Lee ,  Paul Attridge ,  Zaffir A. Chaudhry ,  Scott Goyette ,  Gregory S. Hagen ,  David L. Lincoln ,  Kin Gwn Lore

IPC: G01N21/95 ,  G01N21/88 ,  G06F18/2135 ,  G06T7/00

CPC classification number: G01N21/9515 ,  G01N21/8851 ,  G06F18/2135 ,  G06T7/0004 ,  G01N2021/1765 ,  G01N2021/8861 ,  G01N2021/8887 ,  G06T2207/20081 ,  G06T2207/20084

Abstract: Methods of inspecting fan blades of a gas turbine engine for abnormalities are disclosed. One method utilizes a neural network to determine whether a photographic image of at least one fan blade depicts an abnormality of the at least one fan blade. Another method uses a dimensional reduction technique on one or more first photographic images that depict at least one first fan blade to obtain basis vectors, utilizes the basis vectors to obtain a reconstructed version of a second photographic image that depicts at least one second fan blade, and determines whether the at least one second fan blade includes an abnormality based on a difference between the second photographic image and the reconstructed version of the second photographic image. Another method determines whether a fan blade includes an abnormality based on contrast differences between adjacent areas of an image.

公开(公告)号：US12051185B2

公开(公告)日：2024-07-30

申请号：US17462556

申请日：2021-08-31

Applicant: Ford Global Technologies, LLC

Inventor： Michael Herbert Oelscher ,  Moritz Martinius ,  David Mark Newton ,  Uemit Yigit

IPC: G06T7/00 ,  B23K26/03 ,  B23K31/12 ,  G01N21/88 ,  G06F18/241 ,  G06N3/08

CPC classification number: G06T7/0004 ,  B23K26/032 ,  B23K31/125 ,  G01N21/8851 ,  G06F18/241 ,  G06N3/08 ,  G06T2207/20081 ,  G06T2207/20084 ,  G06T2207/30152

Abstract: A method for determining defects that occur while carrying out a surface modification method of a surface region of a component includes providing an image sequence of a surface region to be assessed. Each image of the image sequence shows an image detail of the surface region and the image details of the individual images overlapping at least partially. The method further includes assigning the individual images to at least two image classes, where at least one image class among the at least two image classes is indicative of a defective image class. The method further includes checking whether a set of individual images of a predeterminable number of directly consecutive individual images in the image sequence have been assigned to the defective image class, and outputting a defect signal.

公开(公告)号：US12039669B2

公开(公告)日：2024-07-16

申请号：US18198760

申请日：2023-05-17

Applicant: STATE FARM MUTUAL AUTOMOBILE INSURANCE COMPANY

Inventor： James M. Freeman ,  Roger D. Schmidgall ,  Patrick H. Boyer ,  Nicholas U. Christopulos ,  Jonathan D. Maurer ,  Nathan L. Tofte ,  Jackie O. Jordan, II

IPC: G06T17/20 ,  B64C39/02 ,  G01N21/64 ,  G01N21/88 ,  G01N22/02 ,  G01S7/481 ,  G01S13/89 ,  G01S15/89 ,  G01S17/86 ,  G01S17/89 ,  G06F30/13 ,  G06Q30/02 ,  G06Q30/0283 ,  G06Q40/08 ,  G06Q50/16 ,  G06Q50/163 ,  G06T1/00 ,  G06T7/00 ,  H04N7/18 ,  H04N13/106 ,  H04N13/254 ,  H04N13/271 ,  H04N13/275 ,  H04R23/00

CPC classification number: G06T17/20 ,  B64C39/024 ,  G01N21/64 ,  G01N21/8851 ,  G01N22/02 ,  G01S7/4817 ,  G01S13/89 ,  G01S15/89 ,  G01S17/86 ,  G01S17/89 ,  G06F30/13 ,  G06Q30/0278 ,  G06Q30/0283 ,  G06Q40/08 ,  G06Q50/16 ,  G06Q50/163 ,  G06T1/0007 ,  G06T7/0002 ,  H04N7/185 ,  H04N13/106 ,  H04N13/254 ,  H04N13/271 ,  H04N13/275 ,  H04R23/008 ,  G01N2201/06113 ,  G01N2201/10 ,  G06T2200/08 ,  G06T2207/10028 ,  G06T2207/10032

Abstract: In a computer-implemented method and system for capturing the condition of a structure, the structure is scanned with an unmanned aerial vehicle (UAV). Data collected by the UAV corresponding to points on a surface of a structure is received and a 3D point cloud is generated for the structure, where the 3D point cloud is generated based at least in part on the received UAV data. A 3D model of the surface of the structure is reconstructed using the 3D point cloud.

公开(公告)号：US20240230551A9

公开(公告)日：2024-07-11

申请号：US18271496

申请日：2021-03-09

Applicant: HITACHI HIGH-TECH CORPORATION

Inventor： Yuta URANO ,  Eiji ARIMA ,  Hiromichi YAMAKAWA ,  Toshifumi HONDA

IPC: G01N21/88 ,  G01N21/93

CPC classification number: G01N21/8806 ,  G01N21/8851 ,  G01N21/93 ,  G01N2021/8848

Abstract: A defect inspection device includes: an illumination optical system including a polarization element configured to switch polarization of irradiation light between first polarization and second polarization orthogonal to the first polarization; a polarization diffraction grating configured to emit diffraction light of a specific order of the irradiation light in a direction along a normal line of a sample stage surface, a diffraction efficiency of the specific order of the first polarization of the irradiation light is equal to or less than 20% of a diffraction efficiency of the specific order of the second polarization, the polarization diffraction grating being settable at a light collection position of the irradiation light on the sample stage surface and including an anisotropic pattern whose period is equal to or less than twice a wavelength of the irradiation light; a detection optical system.