公开(公告)号：US12050182B2

公开(公告)日：2024-07-30

申请号：US18061215

申请日：2022-12-02

申请人： UNIVERSITY OF PITTSBURGH—OF THE COMMONWEALTH SYSTEM OF HIGHER EDUCATION

发明人： Sarah L. Hemler ,  Kurt E. Beschorner

IPC分类号： G02B6/42 ,  G01N21/88 ,  G06T7/00 ,  G06T7/62 ,  H04N23/56

CPC分类号： G01N21/8851 ,  G02B6/42 ,  G06T7/0002 ,  G06T7/62 ,  H04N23/56 ,  G01N2021/8874

摘要： A system for monitoring the tread of a shoe includes a frame member, a waveguide structured to support the shoe when an outer sole of shoe is in contact with a surface of the waveguide, a light source structured to provide light within an edge of the waveguide such that the light will be internally reflected within the waveguide, and an imaging device structured and configured to generate an image of the outer sole of the shoe when the outer sole of shoe is in contact with the waveguide and the light is being provided within the waveguide. The system also includes a controller structured and configured to: (i) receive image data based on the image of the outer sole; (ii) determine from the image data a largest worn region size for the shoe; and (iii) determine a slip risk for the shoe based on the largest worn region size.

公开(公告)号：US20240125712A1

公开(公告)日：2024-04-18

申请号：US18530180

申请日：2023-12-05

申请人： TONGJI UNIVERSITY

发明人： Pinjing He ,  Zhan YANG ,  Hua Zhang ,  Fan Lyu ,  Wei PENG

IPC分类号： G01N21/94 ,  G01N21/17 ,  G01N21/27 ,  G01N21/88 ,  G01N33/44

CPC分类号： G01N21/94 ,  G01N21/27 ,  G01N33/442 ,  G01N2021/1765 ,  G01N2021/8874 ,  G01N2021/8887 ,  G01N2021/945

摘要： The present invention relates to a macro plastic and micro plastic detection method based on RGB and hyperspectral image fusion, which includes the following steps: obtaining macro plastics and micro plastics; mixing with solid wastes to obtain a solid-phase substrate; pretreating the obtained solid-phase substrate to obtain a material; drying to remove part of moisture and coating on a quartz window sheet, drying until the moisture is completely removed, and flattening by using another quartz window sheet to obtain a material to be detected; obtaining an RGB image and a hyperspectral image of the material to be detected respectively by using a high-resolution color image scanner and a hyperspectral camera; fusing the obtained RGB image and hyperspectral image; and automatically classifying and identifying the macro plastics and the micro plastics by using a supervised classification model.

公开(公告)号：US20230358688A1

公开(公告)日：2023-11-09

申请号：US18017485

申请日：2021-07-30

申请人： LG Energy Solution, Ltd.

发明人： Jeong Ho Park ,  Eun Ho Oh ,  Tae Su Kim

IPC分类号： G01N21/88 ,  G01N21/3581 ,  G01N21/94 ,  H01M10/42

CPC分类号： G01N21/8851 ,  G01N21/8806 ,  G01N21/3581 ,  G01N21/94 ,  H01M10/4285 ,  G01N2021/8861 ,  G01N2021/8874 ,  G01N2021/8848

摘要： A debris detection apparatus and a debris detection method, capable of easily detecting a metal debris existing on the surface of an inspection target by emitting electromagnetic waves having a wavelength in a far-infrared band toward the inspection target during a battery manufacturing process and then analyzing the characteristics of reflected waves from the surface of the inspection target through a thermal image recorder.

公开(公告)号：US20180209916A1

公开(公告)日：2018-07-26

申请号：US15880158

申请日：2018-01-25

申请人： Shin-Etsu Chemical Co., Ltd.

发明人： Tsuneo TERASAWA ,  Hiroshi FUKUDA ,  Atsushi YOKOHATA ,  Takahiro KISHITA ,  Daisuke IWAI

IPC分类号： G01N21/88 ,  G01N21/956

CPC分类号： G01N21/8851 ,  G01N21/956 ,  G01N2021/8874 ,  G01N2021/95676 ,  G03F1/84

摘要： A photomask blank having a thin film on a transparent substrate is inspected for defects by irradiating inspection light to a surface region of the blank, collecting the reflected light from the irradiated region via an inspection optical system to form a magnified image of the region, extracting a feature parameter of light intensity distribution from the magnified image, and identifying the bump/pit shape of the defect based on the feature parameter combined with the structure of the thin film. The defect inspection method is effective for discriminating defects of bump or pit shape in a highly reliable manner. On application of the defect inspection method, photomask blanks having no pinhole defects are available at lower costs and higher yields.

公开(公告)号：US20150324643A1

公开(公告)日：2015-11-12

申请号：US14408901

申请日：2013-06-18

申请人： COLLINEO INC. ,  CARTER ENERGIE EOLIENNE INC.

发明人： GUILLAUME LAMBERT ,  MATIAS ARBELECHE ,  JEAN-CHRISTOPHE DEMERS ,  NICOLAS MORENCY ,  GERMAIN BÉLANGER ,  GUILLAUME HUET

IPC分类号： G06K9/00 ,  G06T7/20 ,  H04N5/232 ,  H04N5/247 ,  G01N21/88 ,  H04N5/225

CPC分类号： G06K9/00637 ,  B25J9/1697 ,  G01B11/00 ,  G01M5/0091 ,  G01M11/081 ,  G01N21/88 ,  G01N2021/8867 ,  G01N2021/8874 ,  G06K9/00664 ,  G06T7/20 ,  G08B13/19663 ,  H04N5/2253 ,  H04N5/23238 ,  H04N5/23293 ,  H04N5/247 ,  Y02B10/30

摘要： A method and a system for remote visual inspection of a target surface of a structure, the system comprising a multi-axis assembly; a combination of dynamic digital video cameras and optic supported by said multi-axis assembly; and a controller connected to the cameras and the multi-axis assembly; wherein the multi-axis assembly comprises a turret along a vertical axis, the turret being connected at a top part thereof to a first arm extending along a roll axis, the first arm being connected to a second arm along a pitch axis, the cameras and optic being carried by the second arm.

摘要翻译： 一种用于远程目视检查结构的目标表面的方法和系统，所述系统包括多轴组件; 由所述多轴组件支撑的动态数字摄像机和光学器件的组合; 以及连接到照相机和多轴组件的控制器; 其中所述多轴组件包括沿着垂直轴线的转台，所述转台在其顶部处连接到沿着辊轴线延伸的第一臂，所述第一臂沿着俯仰轴线连接到第二臂，所述照相机和 光学器件由第二臂承载。

公开(公告)号：US20150138342A1

公开(公告)日：2015-05-21

申请号：US14522793

申请日：2014-10-24

申请人： United Technologies Corporation

发明人： Christopher R. Brdar ,  Patrick Hinckley ,  Brian London ,  Larry R. Breen ,  Anita Rebarchak ,  Alan Matthew Finn ,  Chelsea Barr ,  Roger Neama ,  Michael Li

IPC分类号： G01B11/28 ,  G01N21/88

CPC分类号： G01B11/285 ,  G01M5/0016 ,  G01M5/0033 ,  G01N21/8422 ,  G01N21/8851 ,  G01N2021/8874 ,  G01N2201/06113 ,  G01N2201/12

摘要： A method of calculating an amount of visible damage on a component includes capturing an image of the component, identifying an area of visible damage, calculating a size of the area, and communicating the size of visible damage to a storage device. A system for evaluating coating loss is also disclosed.

摘要翻译： 计算组件上的可见损伤量的方法包括捕获部件的图像，识别可见损伤的区域，计算区域的尺寸，以及将可见损伤的大小传达到存储装置。 还公开了一种评估涂层损失的系统。

公开(公告)号：US20140299253A1

公开(公告)日：2014-10-09

申请号：US14354443

申请日：2012-08-28

申请人： Daiki Minamida ,  Koichi Kawase ,  Osamu Kuramata ,  Takashi Mori ,  Keita Oe

发明人： Daiki Minamida ,  Koichi Kawase ,  Osamu Kuramata ,  Takashi Mori ,  Keita Oe

IPC分类号： B32B41/00

CPC分类号： B32B41/00 ,  B29C70/506 ,  B29C70/54 ,  B32B7/06 ,  B32B29/02 ,  B32B2041/04 ,  B32B2250/40 ,  B32B2255/12 ,  B32B2255/26 ,  B32B2262/106 ,  B32B2305/076 ,  B32B2305/08 ,  B32B2305/22 ,  B32B2307/738 ,  B32B2307/748 ,  B32B2313/04 ,  B32B2363/00 ,  B32B2377/00 ,  C08J5/24 ,  G01N21/8422 ,  G01N21/88 ,  G01N21/8806 ,  G01N21/89 ,  G01N21/8914 ,  G01N21/892 ,  G01N21/8921 ,  G01N21/898 ,  G01N21/94 ,  G01N2021/8472 ,  G01N2021/8841 ,  G01N2021/8854 ,  G01N2021/8861 ,  G01N2021/8874 ,  G01N2021/888 ,  G01N2021/8908 ,  G01N2021/8925

摘要： Provided is a method of producing prepreg including: inspecting, with an optical device, in a resin sheet made of a release paper and a resin film which is formed by coating the release paper with a resin to be impregnated into a carbon fiber bundle, the surface of the resin film, detecting a defect in the surface of the resin film which would be the cause of a defect in the prepreg to be produced, and judging the type of the detected defect; or inspecting, with an optical device, the surface of the prepreg after the release paper is separated from the prepreg sheet which is formed by impregnating a resin forming the resin film into the carbon fiber bundle, detecting defects in the surface of the prepreg, and judging the type of the detected defect.

摘要翻译： 本发明提供一种预浸料坯的制造方法，其特征在于，包括：用光学元件检查由剥离纸制成的树脂片和树脂膜，所述树脂片是通过用浸渍在碳纤维束中的树脂涂布所述剥离纸形成的， 树脂膜的表面，检测树脂膜的表面的缺陷，这将导致要生产的预浸料坯的缺陷，并判断检测到的缺陷的类型; 或者在将剥离纸与通过将形成树脂膜的树脂浸渍到碳纤维束中而形成的预浸料片分离后，使用光学装置检查预浸料的表面，检测预浸料坯的表面的缺陷，以及 判断检测到的缺陷的类型。

公开(公告)号：US08711347B2

公开(公告)日：2014-04-29

申请号：US13701030

申请日：2011-05-25

申请人： Toshifumi Honda ,  Yuta Urano ,  Yukihiro Shibata ,  Toshiyuki Nakao

发明人： Toshifumi Honda ,  Yuta Urano ,  Yukihiro Shibata ,  Toshiyuki Nakao

IPC分类号： G01N21/00

CPC分类号： G01N21/8806 ,  G01N21/9501 ,  G01N2021/8874

摘要： Disclosed is a defect inspection method which makes it possible to scan the entire surface of a sample and detect minute defects without causing thermal damage to the sample. A defect inspection method in which a pulse laser emitted from a light source is subjected to pulse division and irradiated on the surface of a sample which moves in one direction while the divided-pulse pulse laser is rotated, reflection light from the sample irradiated by the divided-pulse pulse laser is detected, the signal of the detected reflection light is processed to detect defects on the sample, and information regarding a detected defect is output to a display screen, wherein the barycentric position of the light intensity of the divided-pulse pulse laser is monitored and adjusted.

摘要翻译： 公开了一种缺陷检查方法，其可以扫描样品的整个表面并检测微小缺陷而不会对样品造成热损伤。 对从光源射出的脉冲激光进行脉冲分割并照射在分割脉冲激光器旋转时在一个方向上移动的样品的表面的缺陷检查方法中， 检测出分割脉冲脉冲激光，检测出反射光的信号，以检测样本上的缺陷，将与检测到的缺陷有关的信息输出到显示画面，其中分割脉冲的光强度的重心位置 脉冲激光被监测和调整。

公开(公告)号：US07671978B2

公开(公告)日：2010-03-02

申请号：US11739210

申请日：2007-04-24

申请人： Bryan Clark ,  Andrei Brunfeld ,  Gregory Toker

发明人： Bryan Clark ,  Andrei Brunfeld ,  Gregory Toker

IPC分类号： G01N21/00 ,  G01B11/02

CPC分类号： G01N21/4738 ,  G01N21/8806 ,  G01N2021/8867 ,  G01N2021/8874

摘要： A scatterometer-interferometer and method for detecting and distinguishing characteristics of surface artifacts provides improved artifact detection and increased scanning speed in interferometric measurement systems. A scatterometer and interferometer are combined in a single measurement head and may have overlapping, concentric or separate measurement spots. Interferometric sampling of a surface under measurement may be initiated in response to detection of a surface artifact by the scatterometer, so that continuous scanning of the surface under measurement can be performed until further information about the size and/or height of the artifact is needed.

摘要翻译： 用于检测和区分表面伪影特征的散射仪干涉仪和方法在干涉测量系统中提供改进的伪像检测和增加的扫描速度。 散射仪和干涉仪组合在单个测量头中，并且可以具有重叠的，同心的或分开的测量点。 可以响应于通过散射仪的表面伪影的检测而启动测量下的表面的干涉采样，从而可以执行测量下的表面的连续扫描，直到需要有关伪像大小和/或高度的更多信息。

公开(公告)号：US07456948B2

公开(公告)日：2008-11-25

申请号：US11822330

申请日：2007-07-05

申请人： Takahiro Togashi ,  Shigeru Matsui

发明人： Takahiro Togashi ,  Shigeru Matsui

IPC分类号： G01N21/88 ,  G01N21/86

CPC分类号： G01N21/9501 ,  G01N21/94 ,  G01N2021/8861 ,  G01N2021/8874 ,  G01N2021/95676

摘要： A method and equipment which includes an illustrated-spot illumination-distribution data table for storing an illumination distribution within an illustrated spot and which calculates a coordinate position for a particle or a defect and the diameter of the particle on the basis of detection light intensity data about the particle or defect and the illustrated-spot illumination-distribution data table. Thus, even when the illumination distribution within the illustrated spot based on an actual illumination optical system is not a Gaussian distribution, the calculation of the particle diameter of the detected particle or defect and the calculation of a coordinate position on the surface of an object to be inspected can be attained with an increased accuracy.

摘要翻译： 一种方法和设备，其包括用于存储所示斑点内的照明分布的示出点照度分布数据表，并且基于检测光强度数据计算颗粒或缺陷的坐标位置和颗粒的直径 关于颗粒或缺陷以及所示的点光照度分布数据表。 因此，即使在基于实际的照明光学系统的所示光点内的照明分布不是高斯分布的情况下，检测出的粒子或缺陷的粒径的计算以及物体表面上的坐标位置的计算 被检查可以提高准确度。