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1.发明公开公开(公告)号：US20240175793A1
公开(公告)日：2024-05-30
申请号：US18521145
申请日：2023-11-28
CPC分类号： G01N3/12 , G01N3/06 , G01N2203/0017 , G01N2203/0411
摘要： Disclosed example apparatus to align a test specimen in a universal testing system include: a first specimen grip configured to be attached to a universal testing system, to hold a test specimen in a first orientation with respect to the universal testing system, and to move the test specimen toward a test axis of the universal testing system; and a specimen stop configured to be attached to the universal testing system and to set a stop point of the test specimen, the first specimen grip and the specimen stop configured to align the test specimen with the test axis.
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公开(公告)号：US11885773B2
公开(公告)日：2024-01-30
申请号：US16887960
申请日：2020-05-29
CPC分类号： G01N3/20 , G01N3/066 , G01N2203/003 , G01N2203/0023 , G01N2203/0282 , G01N2203/04 , G01N2203/0617
摘要： An example flexible substrate testing system includes: a first substrate support structure configured to hold stationary a first portion of a flexible substrate under test; a second substrate support structure configured to hold a second portion of the flexible substrate; an actuator configured to move the second substrate support structure to fold the flexible substrate and to unfold the flexible substrate; and a load cell configured to measure a load on the flexible substrate.
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公开(公告)号：US20240248020A1
公开(公告)日：2024-07-25
申请号：US18427272
申请日：2024-01-30
CPC分类号： G01N3/20 , G01N3/066 , G01N2203/0023 , G01N2203/003 , G01N2203/0282 , G01N2203/04 , G01N2203/0617
摘要： An example flexible substrate testing system includes: a first substrate support structure configured to hold stationary a first portion of a flexible substrate under test; a second substrate support structure configured to hold a second portion of the flexible substrate; an actuator configured to move the second substrate support structure to fold the flexible substrate and to unfold the flexible substrate; and a load cell configured to measure a load on the flexible substrate.
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公开(公告)号：US20240011752A1
公开(公告)日：2024-01-11
申请号：US18348142
申请日：2023-07-06
IPC分类号： G01B5/06
CPC分类号： G01B5/06
摘要： Example specimen measurement devices include a clamp; a single actuator configured to control the clamp to position a specimen with a clamping force; a measurement probe configured to contact the clamped specimen with a probing force; and a single position sensor configured to measure a dimension of the clamped specimen based on detecting a position of the measurement probe.
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公开(公告)号：US20210018412A1
公开(公告)日：2021-01-21
申请号：US16887960
申请日：2020-05-29
摘要： An example flexible substrate testing system includes: a first substrate support structure configured to hold stationary a first portion of a flexible substrate under test; a second substrate support structure configured to hold a second portion of the flexible substrate; an actuator configured to move the second substrate support structure to fold the flexible substrate and to unfold the flexible substrate; and a load cell configured to measure a load on the flexible substrate.
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