公开(公告)号：US20190109499A1

公开(公告)日：2019-04-11

申请号：US16154665

申请日：2018-10-08

Applicant: Integrated Device Technology, Inc.

Inventor： Nicholaus Smith ,  Stefan Maireanu ,  Haiwen Jiang ,  David Wilson

IPC: H02J50/60 ,  H02J50/12 ,  H02M3/158 ,  H02J50/70

Abstract: In accordance with some embodiments of the present invention, a method of determining a Q-factor in a transmit circuit with a resonant circuit includes setting a system voltage; performing a coarse scan to determine a course resonant frequency; performing a fine scan based on the course scan to determine a resonant frequency; performing a final measurement at the resonant frequency to determine an average system voltage and an average peak voltage of the resonant circuit; calculating a Q parameter from the average system voltage and the average peak voltage; and calculating the Q-factor from the Q parameter.

公开(公告)号：US10797535B2

公开(公告)日：2020-10-06

申请号：US16154665

申请日：2018-10-08

Applicant: Integrated Device Technology, Inc.

Inventor： Nicholaus Smith ,  Stefan Maireanu ,  Haiwen Jiang ,  David Wilson

IPC: H02J50/60 ,  H02J50/70 ,  H02M3/158 ,  H02J50/12 ,  H02M3/156

Abstract: In accordance with some embodiments of the present invention, a method of determining a Q-factor in a transmit circuit with a resonant circuit includes setting a system voltage; performing a coarse scan to determine a course resonant frequency; performing a fine scan based on the course scan to determine a resonant frequency; performing a final measurement at the resonant frequency to determine an average system voltage and an average peak voltage of the resonant circuit; calculating a Q parameter from the average system voltage and the average peak voltage; and calculating the Q-factor from the Q parameter.