Q-FACTOR MEASUREMENT
    1.
    发明申请

    公开(公告)号:US20190109499A1

    公开(公告)日:2019-04-11

    申请号:US16154665

    申请日:2018-10-08

    Abstract: In accordance with some embodiments of the present invention, a method of determining a Q-factor in a transmit circuit with a resonant circuit includes setting a system voltage; performing a coarse scan to determine a course resonant frequency; performing a fine scan based on the course scan to determine a resonant frequency; performing a final measurement at the resonant frequency to determine an average system voltage and an average peak voltage of the resonant circuit; calculating a Q parameter from the average system voltage and the average peak voltage; and calculating the Q-factor from the Q parameter.

    Q-factor measurement
    2.
    发明授权

    公开(公告)号:US10797535B2

    公开(公告)日:2020-10-06

    申请号:US16154665

    申请日:2018-10-08

    Abstract: In accordance with some embodiments of the present invention, a method of determining a Q-factor in a transmit circuit with a resonant circuit includes setting a system voltage; performing a coarse scan to determine a course resonant frequency; performing a fine scan based on the course scan to determine a resonant frequency; performing a final measurement at the resonant frequency to determine an average system voltage and an average peak voltage of the resonant circuit; calculating a Q parameter from the average system voltage and the average peak voltage; and calculating the Q-factor from the Q parameter.

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