公开(公告)号：US10797535B2

公开(公告)日：2020-10-06

申请号：US16154665

申请日：2018-10-08

Applicant: Integrated Device Technology, Inc.

Inventor： Nicholaus Smith ,  Stefan Maireanu ,  Haiwen Jiang ,  David Wilson

IPC: H02J50/60 ,  H02J50/70 ,  H02M3/158 ,  H02J50/12 ,  H02M3/156

Abstract: In accordance with some embodiments of the present invention, a method of determining a Q-factor in a transmit circuit with a resonant circuit includes setting a system voltage; performing a coarse scan to determine a course resonant frequency; performing a fine scan based on the course scan to determine a resonant frequency; performing a final measurement at the resonant frequency to determine an average system voltage and an average peak voltage of the resonant circuit; calculating a Q parameter from the average system voltage and the average peak voltage; and calculating the Q-factor from the Q parameter.

公开(公告)号：US10804750B2

公开(公告)日：2020-10-13

申请号：US15998784

申请日：2018-08-16

Applicant: Integrated Device Technology, Inc.

Inventor： Rui Liu ,  Zhitong Guo ,  Haiwen Jiang

IPC: H02J50/60 ,  H02J50/12 ,  G01V3/38 ,  G01R27/26 ,  H02J7/02 ,  G01V3/10

Abstract: A method of measuring a Q-factor in a wireless power transmitter includes charging a capacitor in a LC tank circuit that includes a transmission coil to a voltage; starting a Q-factor determining by coupling the LC tank circuit to ground to form a free-oscillating circuit; monitoring the voltage across the capacitor as a function of time as the LC tank circuit oscillates; and determining the resonant frequency and the Q-factor from monitoring the voltage.

公开(公告)号：US20190109499A1

公开(公告)日：2019-04-11

申请号：US16154665

申请日：2018-10-08

Applicant: Integrated Device Technology, Inc.

Inventor： Nicholaus Smith ,  Stefan Maireanu ,  Haiwen Jiang ,  David Wilson

IPC: H02J50/60 ,  H02J50/12 ,  H02M3/158 ,  H02J50/70

Abstract: In accordance with some embodiments of the present invention, a method of determining a Q-factor in a transmit circuit with a resonant circuit includes setting a system voltage; performing a coarse scan to determine a course resonant frequency; performing a fine scan based on the course scan to determine a resonant frequency; performing a final measurement at the resonant frequency to determine an average system voltage and an average peak voltage of the resonant circuit; calculating a Q parameter from the average system voltage and the average peak voltage; and calculating the Q-factor from the Q parameter.