DATA STORAGE DEVICE WITH DEFECTIVE DIE INDICATOR

    公开(公告)号:US20190042112A1

    公开(公告)日:2019-02-07

    申请号:US15927042

    申请日:2018-03-20

    Abstract: Embodiments of the present disclosure may relate to a data storage controller that may include a non-volatile memory, and a processor coupled with the non-volatile memory to perform a scan of a plurality of non-volatile memory dies in a multi-die memory package to detect one or more defective non-volatile memory dies, where an individual non-volatile memory die of the plurality of non-volatile memory dies is defective if the individual non-volatile memory die has a number of bad blocks that exceeds a predefined threshold, and store one or more defective die indicators in a die topology in the non-volatile memory based at least in part on the scan, where the one or more defective die indicators correspond to the one or more defective non-volatile memory dies. Other embodiments may be described and/or claimed.

Patent Agency Ranking