公开(公告)号：US20240231136A9

公开(公告)日：2024-07-11

申请号：US18490130

申请日：2023-10-19

Applicant: Japan Display Inc.

Inventor： Masayuki IKARI ,  Akihiko FUJISAWA

IPC: G02F1/13 ,  G09G3/00

CPC classification number: G02F1/1309 ,  G09G3/006

Abstract: A method for inspecting a semiconductor device in which each of a plurality of reflective elements includes a liquid crystal. The method includes the steps of acquiring a first capacitance corresponding to each of the plurality of reflective elements after inputting a first voltage signal to the semiconductor device so that a dielectric constant of the liquid crystal is in a predetermined first state in each of the plurality of reflective elements, acquiring a second capacitance corresponding to each of the plurality of reflective elements after inputting a second voltage signal to the semiconductor device so that a dielectric constant of the liquid crystal is in a predetermined second state in each of the plurality of reflective elements, calculating a difference value between the first capacitance and the second capacitance, and determining whether the difference value is less than or equal to a predetermined threshold value.

公开(公告)号：US20220011638A1

公开(公告)日：2022-01-13

申请号：US17305408

申请日：2021-07-07

Applicant: Japan Display Inc.

Inventor： Takayuki IMAI ,  Masayuki IKARI

IPC: G02F1/1362

Abstract: According to one embodiment, a display device includes a first transparent substrate having a first side surface extending over a first area, a second area and a third area, a second transparent substrate opposed to the first transparent substrate in the third area, a polymer dispersed liquid crystal layer, a first wiring board mounted with a first light-emitting element in the first area, a second wiring board mounted with a second light-emitting element in the second area, a first terminal connected to a power supply in the first area, a second terminal connected to the second wiring board in the second area, and a first conductive layer arranged on the first side surface and connected to the first terminal and the second terminal.

公开(公告)号：US20240134217A1

公开(公告)日：2024-04-25

申请号：US18490130

申请日：2023-10-18

Applicant: Japan Display Inc.

Inventor： Masayuki IKARI ,  Akihiko FUJISAWA

IPC: G02F1/13 ,  G09G3/00

CPC classification number: G02F1/1309 ,  G09G3/006

Abstract: A method for inspecting a semiconductor device in which each of a plurality of reflective elements includes a liquid crystal. The method includes the steps of acquiring a first capacitance corresponding to each of the plurality of reflective elements after inputting a first voltage signal to the semiconductor device so that a dielectric constant of the liquid crystal is in a predetermined first state in each of the plurality of reflective elements, acquiring a second capacitance corresponding to each of the plurality of reflective elements after inputting a second voltage signal to the semiconductor device so that a dielectric constant of the liquid crystal is in a predetermined second state in each of the plurality of reflective elements, calculating a difference value between the first capacitance and the second capacitance, and determining whether the difference value is less than or equal to a predetermined threshold value.

公开(公告)号：US20250015508A1

公开(公告)日：2025-01-09

申请号：US18893986

申请日：2024-09-24

Applicant: Japan Display Inc.

Inventor： Daiichi SUZUKI ,  Takanori TSUNASHIMA ,  Masayuki IKARI ,  Shinichiro OKA ,  Mitsutaka OKITA ,  Kazuki MATSUNAGA

IPC: H01Q15/14

Abstract: A reflect array includes a plurality of patch electrodes arranged spaced apart and interconnected to an incident surface of a radio wave, a plurality of control electrodes arranged spaced apart to correspond to the plurality of patch electrodes and disposed on a rear side of the plurality of patch electrodes, a liquid crystal layer between the plurality of patch electrodes and the plurality of control electrodes, and an auxiliary electrode disposed to overlap a separated region of the plurality of control electrodes.