公开(公告)号：US20190115144A1

公开(公告)日：2019-04-18

申请号：US16152568

申请日：2018-10-05

Applicant: KOREA BASIC SCIENCE INSTITUTE

Inventor： Seung-young Park ,  Jungmin Jong Park

IPC: H01F27/28 ,  H01F7/20 ,  H01F27/24 ,  H01F27/32 ,  H01F27/02 ,  H01F27/10

Abstract: The present invention relates to a bobbin and a coil assembly and electromagnet equipment including the same, and the electromagnet equipment, which includes a bobbin and a coil, includes a coil assembly receiving a refrigerant so as to remove heat produced when magnetic field lines are famed by an electric current running through the coil while the coil is wound on a center shaft relative to the center shaft provided on a center of the bobbin; and a terminal block provided on a lower side of the coil assembly, the terminal block supporting the coil assembly and receiving a refrigerant from outside and supplying the refrigerant to the coil assembly.

公开(公告)号：US11193988B2

公开(公告)日：2021-12-07

申请号：US16687213

申请日：2019-11-18

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE ,  KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY ,  KOREA BASIC SCIENCE INSTITUTE

Inventor： Kyoung-Woong Moon ,  Chan Yong Hwang ,  Byoung-Chul Min ,  Seung-young Park

IPC: G01R33/05 ,  H01F10/30 ,  G01R33/12 ,  G01R33/00 ,  G01R33/032 ,  H01F10/32

Abstract: Provided is a method of measuring a magnitude of magnetization of a perpendicular magnetic thin film, including: forming a stripe pattern in which a first magnetic domain that extends in a y direction and is magnetized in a z direction and a second magnetic domain that extends in the y direction and is magnetized in a direction opposite to the z direction are arranged alternately in an x direction, in a perpendicular magnetic thin film that extends in an xy plane; changing widths in the x direction, of the first and second magnetic domains by applying a magnetic field having a predetermined magnitude, in the z direction, to the perpendicular magnetic thin film; and calculating an absolute value of the magnetization of the perpendicular magnetic thin film on the basis of a ratio between the widths in the x direction, of the first magnetic domain and the second magnetic domain.

公开(公告)号：US20180364181A1

公开(公告)日：2018-12-20

申请号：US15974111

申请日：2018-05-08

Applicant: KOREA BASIC SCIENCE INSTITUTE ,  KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY

Inventor： Seung-young Park ,  Sang-il Kim ,  Younghun Jo ,  Byoung-Chul Min

IPC: G01N22/02

Abstract: Disclosed is a wafer inspection apparatus. The wafer inspection apparatus includes: a magnetic field generating unit forming a magnetic field such that magnetic lines of force flow in a direction perpendicular or parallel to a first surface of a wafer on which a magnetic thin film is formed; a microwave guide unit emitting microwaves to a measurement region that is at least a partial region of the wafer and is a region affected by the magnetic field generated by the magnetic field generating unit; and a sensing unit receiving waves reflected or transmitted after the microwaves are emitted to the measurement region from the microwave guide unit.