Digital x-ray detector and thin-film transistor array substrate for the same

    公开(公告)号:US11348963B2

    公开(公告)日:2022-05-31

    申请号:US16666265

    申请日:2019-10-28

    Abstract: The present disclosure relates to a digital X-ray detector and a thin-film transistor array substrate for the same. Disclosed is a thin-film transistor array substrate for a digital X-ray detector in which deterioration of electrical characteristics of a thin-film transistors made of an oxide semiconductor may be reduced or minimized and aging of a PIN diode caused by external moisture may be reduced or minimized. Further, disclosed is a digital X-ray detector including the array substrate. To this end, the array substrate includes a second protective layer having a variety of patterns so as to cover at least a portion of the PIN diode but not to cover the thin-film transistor. The second protective layer includes SiNx. Thus, a de-hydrogenation path from the thin-film transistor may be secured and an external moisture barrier effect for the PIN diode may be achieved.

    THIN FILM TRANSISTOR, ELECTROLUMINESCENT DISPLAY DEVICE AND DRIVING TRANSISTOR

    公开(公告)号:US20240081098A1

    公开(公告)日:2024-03-07

    申请号:US18240968

    申请日:2023-08-31

    CPC classification number: H10K59/1213 H10K59/126

    Abstract: The present disclosure provides a thin film transistor, an electroluminescent display device and a driving transistor. A thin film transistor according to an exemplary embodiment of the present disclosure includes a semiconductor layer, a first insulating layer disposed on the semiconductor layer, two or more first gate electrodes disposed on the first insulating layer and separated from each other, a second insulating layer disposed on the first gate electrodes, a source electrode and a drain electrode disposed on the second insulating layer and respectively electrically connected to a source region and a drain region of the semiconductor layer and a second gate electrode disposed above the first gate electrodes, a channel region may be configured between the source region and the drain region. As a result, it becomes possible to increase subthreshold swing (SS) value, and thus, it becomes possible to improve low gradation spots without increasing a bezel width.

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