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公开(公告)号:US20240430185A1
公开(公告)日:2024-12-26
申请号:US18216799
申请日:2023-06-30
Applicant: LitePoint Corporation
Inventor: Chen CAO , Christian Volf Olgaard , Ruizu Wang , Qingjie Lu
IPC: H04L43/0852
Abstract: An example system includes a signal generator to output signals based on multiple carrier frequencies; a wired transmission medium for carrying the signals, where the wired transmission medium is configured as open ended to produce reflections on the wired transmission medium of the signals; and a signal analyzer to receive the reflections and to determine a transmission time of a signal along the wired transmission medium based on the reflections. The signal analyzer is configured to perform operations that include performing a search based on an estimated transmission time of the signal along the wired transmission medium and the reflections to determine the transmission time. The search is to determine which of multiple candidate transmission times to select for the transmission time.
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公开(公告)号:US20230370172A1
公开(公告)日:2023-11-16
申请号:US17746230
申请日:2022-05-17
Applicant: LitePoint Corporation
Inventor: Chen CAO , Christian Volf OLGAARD , Ruizu WANG , Qingjie LU
IPC: H04B17/00
CPC classification number: H04B17/0085
Abstract: An example process determines a first error vector magnitude (EVM) of a signal output by a device under test (DUT). The process includes adding attenuation on a signal path between the DUT and a vector signal analyzer (VSA), where the attenuation is changeable: measuring, at the VSA, at least two second EVMs for different values of attenuation of the signal output by the DUT, where the at least two second EVMs are corrupted by noise from the VSA, and where each of the at least two second EVMs is based on two or more measurements; and determining the first EVM based on a linear relationship that is based on the first EVM, the at least two second EVMs, and a function based on the attenuation, where the first EVM is without at least some of the noise from the VSA.
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公开(公告)号:US20240361367A1
公开(公告)日:2024-10-31
申请号:US18143886
申请日:2023-05-05
Applicant: LitePoint Corporation
Inventor: Chen CAO , Christian Volf Olgaard , Ruizu Wang , Qingjie Lu
Abstract: An example method includes following operations: (i) receiving a device signal from a device under test (DUT); (ii) setting an attenuation value; (iii) applying the attenuation value to the device signal to produce an attenuated device signal for a frequency spectrum analyzing device, where the frequency spectrum analyzing device produces a noise signal and intermodulation interference; (iv) obtaining a power spectral density value, where the power spectral density value comprises a power, at a frequency value, of a combined signal that is based on the attenuated device signal, the noise signal, and the intermodulation interference; (v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values; (vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values; and (vii) obtaining a power spectral density of the device signal.
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