公开(公告)号：US11032725B1

公开(公告)日：2021-06-08

申请号：US16822523

申请日：2020-03-18

Applicant: LitePoint Corporation

Inventor： Christian Volf Olgaard ,  Ruizu Wang ,  Chen Cao

IPC: H04W24/04 ,  H04W24/06 ,  H04B17/29 ,  G01R31/302 ,  G01R31/319

Abstract: System and method for testing a wireless data packet signal transceiver device under test (DUT) in which external control circuitry manages initiation of execution by a tester of test program instructions defining multiple self-terminating test control sequences in one or more desired sequences. The test control sequences may be pre-stored in a tester for subsequent execution under control of control signals sourced externally by the external control circuitry via separate control signals.

公开(公告)号：US20240361376A1

公开(公告)日：2024-10-31

申请号：US18144019

申请日：2023-05-05

Applicant: LitePoint Corporation

Inventor： Chen Cao ,  Christian Volf Olgaard ,  Ruizu Wang ,  Qingjie Lu

IPC: G01R31/28 ,  G01R23/18

CPC classification number: G01R31/2837 ,  G01R23/18 ,  G01R31/2841

Abstract: An example method includes the following operations: (i) receiving a device signal from a device under test (DUT); (ii) setting an attenuation value; (iii) applying the attenuation value to the device signal to produce an attenuated device signal for a frequency spectrum analyzing device, where the frequency spectrum analyzing device produces a noise signal; (iv) obtaining a power spectral density value using the frequency spectrum analyzing device, where a power spectral density comprises a power, at a frequency value, of a combined signal that is based on the attenuated device signal and the noise signal; (v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values; (vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values; and (vii) obtaining a power spectral density of the device signal.

公开(公告)号：US20190190840A1

公开(公告)日：2019-06-20

申请号：US15842407

申请日：2017-12-14

Applicant: LitePoint Corporation

Inventor： Chen Cao ,  Christian Volf Olgaard ,  Ruizu Wang

IPC: H04L12/841 ,  H04L12/825 ,  H04L12/26

CPC classification number: H04L47/283 ,  H04L43/10 ,  H04L43/50 ,  H04L47/26

Abstract: A method for testing a data packet signal transceiver device under test (DUT). Following initial signal communications with a DUT, timing of further transmissions by the DUT may be effectively controlled by transmitting congestive communication channel signals to cause the DUT to detect apparent communication channel activity and in response thereto delay its own signal transmissions.

公开(公告)号：US11838776B2

公开(公告)日：2023-12-05

申请号：US17078625

申请日：2020-10-23

Applicant: LitePoint Corporation

Inventor： Christian Volf Olgaard ,  Ruizu Wang ,  Chen Cao

IPC: H04W24/08

CPC classification number: H04W24/08

Abstract: A system and method for using a wireless radio frequency (RF) data packet signaling link to enable non-link control of testing of a data packet signal transceiver device under test (DUT) in which a communication session between a tester and a DUT for purposes of testing the DUT may first be initiated by a separate, commonly available, and lower cost, communication device. Following its establishment, the tester may monitor the communication session, e.g., via wireless signal sniffing, to acquire and use associated device identification information to join the session and transmit trigger based test (TBT) data packets for initiating a test sequence within the DUT. Hence, use of a non-link capable tester to perform parametric testing of a DUT at the lowest network architecture layer, e.g., the physical (PHY) layer, may be enabled.

公开(公告)号：US11817913B1

公开(公告)日：2023-11-14

申请号：US17746230

申请日：2022-05-17

Applicant: LitePoint Corporation

Inventor： Chen Cao ,  Christian Volf Olgaard ,  Ruizu Wang ,  Qingjie Lu

IPC: H04B17/00

CPC classification number: H04B17/0085

Abstract: An example process determines a first error vector magnitude (EVM) of a signal output by a device under test (DUT). The process includes adding attenuation on a signal path between the DUT and a vector signal analyzer (VSA), where the attenuation is changeable: measuring, at the VSA, at least two second EVMs for different values of attenuation of the signal output by the DUT, where the at least two second EVMs are corrupted by noise from the VSA, and where each of the at least two second EVMs is based on two or more measurements; and determining the first EVM based on a linear relationship that is based on the first EVM, the at least two second EVMs, and a function based on the attenuation, where the first EVM is without at least some of the noise from the VSA.

公开(公告)号：US11742970B1

公开(公告)日：2023-08-29

申请号：US17875782

申请日：2022-07-28

Applicant: LitePoint Corporation

Inventor： Chen Cao ,  Christian Volf Olgaard ,  Ruizu Wang ,  Qingjie Lu

IPC: H04B17/345 ,  H04B1/04 ,  H04L27/26

CPC classification number: H04B17/345 ,  H04B1/0475 ,  H04L27/2614

Abstract: An example test system includes memory (e.g., one or more memory devices) storing (i) instructions that are executable, and (ii) a mapping function that relates first error vector magnitudes (EVMs) for first symbols to second EVMs for the first symbols, where the first EVMs are corrupted by radio frequency (RF) noise and the second EVMs are corrupted by both RF noise and symbol decoding errors. The test system also includes a decoder to receive a signal from a device under test, and to obtain a third EVM for a second symbol that is based on the signal, where the third EVM is corrupted by both RF noise and a symbol decoding error. One or more processing devices are configured to execute the instructions to adjust the third EVM using the mapping function to correct the symbol decoding error in the third EVM.

公开(公告)号：US11598803B1

公开(公告)日：2023-03-07

申请号：US17352553

申请日：2021-06-21

Applicant: LitePoint Corporation

Inventor： Chen Cao ,  Christian Volf Olgaard ,  Ray Wang

IPC: G01R31/302 ,  H04B3/48

Abstract: System and method for compensating for power loss due to a radio frequency (RF) signal probe mismatch in conductive RF signal testing of a RF data signal transceiver device under test (DUT). Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies enables isolation of and compensation for power loss due to a mismatch between the RF signal probe and RF DUT connection based on predetermined losses of the RF signal path.

公开(公告)号：US11855707B2

公开(公告)日：2023-12-26

申请号：US17352546

申请日：2021-06-21

Applicant: LitePoint Corporation

Inventor： Chen Cao ,  Christian Volf Olgaard ,  Ray Wang

IPC: H04B17/00 ,  G01R31/28

CPC classification number: H04B17/0085 ,  G01R31/2822

Abstract: System and method for measuring path loss of a conductive radio frequency (RF) signal path used in testing a RF data signal transceiver device under test (DUT) with a RF vector signal transceiver. A path loss measurement may be performed by initially leaving an open connection at the RF signal path end normally connected to the DUT during DUT testing. Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies avoids need for additional testing with shorted and loaded connections at the RF signal path end.

公开(公告)号：US20220407610A1

公开(公告)日：2022-12-22

申请号：US17352546

申请日：2021-06-21

Applicant: LitePoint Corporation

Inventor： Chen Cao ,  Christian Volf Olgaard ,  Ray Wang

IPC: H04B17/00 ,  G01R31/28

Abstract: System and method for measuring path loss of a conductive radio frequency (RF) signal path used in testing a RF data signal transceiver device under test (DUT) with a RF vector signal transceiver. A path loss measurement may be performed by initially leaving an open connection at the RF signal path end normally connected to the DUT during DUT testing. Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies avoids need for additional testing with shorted and loaded connections at the RF signal path end.

公开(公告)号：US20220132340A1

公开(公告)日：2022-04-28

申请号：US17078625

申请日：2020-10-23

Applicant: LitePoint Corporation

Inventor： Christian Volf Olgaard ,  Ruizu Wang ,  Chen Cao

IPC: H04W24/08

Abstract: A system and method for using a wireless radio frequency (RF) data packet signaling link to enable non-link control of testing of a data packet signal transceiver device under test (DUT) in which a communication session between a tester and a DUT for purposes of testing the DUT may first be initiated by a separate, commonly available, and lower cost, communication device. Following its establishment, the tester may monitor the communication session, e.g., via wireless signal sniffing, to acquire and use associated device identification information to join the session and transmit trigger based test (TBT) data packets for initiating a test sequence within the DUT. Hence, use of a non-link capable tester to perform parametric testing of a DUT at the lowest network architecture layer, e.g., the physical (PHY) layer, may be enabled.