公开(公告)号：US20240361367A1

公开(公告)日：2024-10-31

申请号：US18143886

申请日：2023-05-05

Applicant: LitePoint Corporation

Inventor： Chen CAO ,  Christian Volf Olgaard ,  Ruizu Wang ,  Qingjie Lu

IPC: G01R23/18 ,  G01R27/30 ,  G01R29/26

CPC classification number: G01R23/18 ,  G01R27/30 ,  G01R29/26

Abstract: An example method includes following operations: (i) receiving a device signal from a device under test (DUT); (ii) setting an attenuation value; (iii) applying the attenuation value to the device signal to produce an attenuated device signal for a frequency spectrum analyzing device, where the frequency spectrum analyzing device produces a noise signal and intermodulation interference; (iv) obtaining a power spectral density value, where the power spectral density value comprises a power, at a frequency value, of a combined signal that is based on the attenuated device signal, the noise signal, and the intermodulation interference; (v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values; (vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values; and (vii) obtaining a power spectral density of the device signal.

公开(公告)号：US11817913B1

公开(公告)日：2023-11-14

申请号：US17746230

申请日：2022-05-17

Applicant: LitePoint Corporation

Inventor： Chen Cao ,  Christian Volf Olgaard ,  Ruizu Wang ,  Qingjie Lu

IPC: H04B17/00

CPC classification number: H04B17/0085

Abstract: An example process determines a first error vector magnitude (EVM) of a signal output by a device under test (DUT). The process includes adding attenuation on a signal path between the DUT and a vector signal analyzer (VSA), where the attenuation is changeable: measuring, at the VSA, at least two second EVMs for different values of attenuation of the signal output by the DUT, where the at least two second EVMs are corrupted by noise from the VSA, and where each of the at least two second EVMs is based on two or more measurements; and determining the first EVM based on a linear relationship that is based on the first EVM, the at least two second EVMs, and a function based on the attenuation, where the first EVM is without at least some of the noise from the VSA.

公开(公告)号：US11742970B1

公开(公告)日：2023-08-29

申请号：US17875782

申请日：2022-07-28

Applicant: LitePoint Corporation

Inventor： Chen Cao ,  Christian Volf Olgaard ,  Ruizu Wang ,  Qingjie Lu

IPC: H04B17/345 ,  H04B1/04 ,  H04L27/26

CPC classification number: H04B17/345 ,  H04B1/0475 ,  H04L27/2614

Abstract: An example test system includes memory (e.g., one or more memory devices) storing (i) instructions that are executable, and (ii) a mapping function that relates first error vector magnitudes (EVMs) for first symbols to second EVMs for the first symbols, where the first EVMs are corrupted by radio frequency (RF) noise and the second EVMs are corrupted by both RF noise and symbol decoding errors. The test system also includes a decoder to receive a signal from a device under test, and to obtain a third EVM for a second symbol that is based on the signal, where the third EVM is corrupted by both RF noise and a symbol decoding error. One or more processing devices are configured to execute the instructions to adjust the third EVM using the mapping function to correct the symbol decoding error in the third EVM.

公开(公告)号：US20240430185A1

公开(公告)日：2024-12-26

申请号：US18216799

申请日：2023-06-30

Applicant: LitePoint Corporation

Inventor： Chen CAO ,  Christian Volf Olgaard ,  Ruizu Wang ,  Qingjie Lu

IPC: H04L43/0852

Abstract: An example system includes a signal generator to output signals based on multiple carrier frequencies; a wired transmission medium for carrying the signals, where the wired transmission medium is configured as open ended to produce reflections on the wired transmission medium of the signals; and a signal analyzer to receive the reflections and to determine a transmission time of a signal along the wired transmission medium based on the reflections. The signal analyzer is configured to perform operations that include performing a search based on an estimated transmission time of the signal along the wired transmission medium and the reflections to determine the transmission time. The search is to determine which of multiple candidate transmission times to select for the transmission time.

公开(公告)号：US20240361376A1

公开(公告)日：2024-10-31

申请号：US18144019

申请日：2023-05-05

Applicant: LitePoint Corporation

Inventor： Chen Cao ,  Christian Volf Olgaard ,  Ruizu Wang ,  Qingjie Lu

IPC: G01R31/28 ,  G01R23/18

CPC classification number: G01R31/2837 ,  G01R23/18 ,  G01R31/2841

Abstract: An example method includes the following operations: (i) receiving a device signal from a device under test (DUT); (ii) setting an attenuation value; (iii) applying the attenuation value to the device signal to produce an attenuated device signal for a frequency spectrum analyzing device, where the frequency spectrum analyzing device produces a noise signal; (iv) obtaining a power spectral density value using the frequency spectrum analyzing device, where a power spectral density comprises a power, at a frequency value, of a combined signal that is based on the attenuated device signal and the noise signal; (v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values; (vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values; and (vii) obtaining a power spectral density of the device signal.