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公开(公告)号:US10027885B2
公开(公告)日:2018-07-17
申请号:US14797485
申请日:2015-07-13
Applicant: MITUTOYO CORPORATION
Inventor: Gyokubu Cho , Akira Takada , Takashi Hanamura , Takuho Maeda
Abstract: An image measuring apparatus is configured such that an image of a measured object placed on a stage is captured by a camera, the captured image is displayed on, a captured image display screen, and determination results based on results of a measurement are displayed in an overview list separately from the captured image of the measured object. The image measuring apparatus includes an individual determination results display region displaying individual determination results for each measurement position; and an overall determination results display region displaying overall determination results for the measured object as a unit. The image measuring apparatus is configured to display the individual determination results and the overall determination results together.
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公开(公告)号:US10102631B2
公开(公告)日:2018-10-16
申请号:US15085027
申请日:2016-03-30
Applicant: MITUTOYO CORPORATION
Inventor: Hiroyuki Yoshida , Akira Takada , Makoto Kaieda , Gyokubu Cho , Koichi Komatsu , Hidemitsu Asano , Takashi Hanamura , Takuho Maeda , Isao Tokuhara
Abstract: A distance in a scanning direction between a first set of edges which face each other and exhibit an opposite change between light and dark is measured by an image measuring machine, and a bias correction value is calculated based on a difference between a measured value and a true value. Using the bias correction value, detection point correction values, which are correction values in various directions of edge detection points detected by a scan of a measured object using the image measuring machine, are calculated; a correction amount used in correction of the edge detection points is specified based on the detection point correction value in each direction; and the edge detection points are corrected using the correction amount.
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公开(公告)号:US11257205B2
公开(公告)日:2022-02-22
申请号:US15384713
申请日:2016-12-20
Applicant: MITUTOYO CORPORATION
Inventor: Gyokubu Cho , Koichi Komatsu , Akira Takada , Hiroyuki Yoshida , Takashi Hanamura , Takuho Maeda , Makoto Kaieda , Isao Tokuhara
Abstract: An image measuring method performed with an image measuring device measuring a dimension of a measured object from an image of the measured object captured by an image capturer. The method executes a standard reference object measurement measuring a dimension of the standard reference object with the image measuring device; a standard reference dimension input inputting a dimension of the standard reference object specified by a device other than the image measuring device; a preset value calculation calculating a preset value from the dimension of the measured standard reference object and from a dimension of the standard reference object measured by a predetermined measurement tool; a measurement measuring a dimension of a measured object other than the standard reference object using the image measuring device; and a correction correcting the dimension of the measured object other than the standard reference object measured by the image measuring device.
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公开(公告)号:US10163201B2
公开(公告)日:2018-12-25
申请号:US15251324
申请日:2016-08-30
Applicant: MITUTOYO CORPORATION
Inventor: Takeshi Sawa , Takashi Hanamura , Akira Takada , Takuho Maeda
Abstract: A hardness tester includes a memory associating and storing a parts program having defined measurement conditions with respect to a sample, including a test position, and an image file acquired by capturing an image of the shape of the sample; an image acquirer acquiring image data of the sample to be measured; a pattern matcher performing a pattern matching process on the image data of the sample using the image file associated with the parts program; a determiner determining whether an image file exists which has a shape related to the image data of the sample; a retriever retrieving the parts program associated with the image file having a related shape; and a measurer measuring hardness of the sample based on the retrieved parts program.
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