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公开(公告)号:US10295337B2
公开(公告)日:2019-05-21
申请号:US15433234
申请日:2017-02-15
Applicant: MITUTOYO CORPORATION
Inventor: Sadayuki Matsumiya , Shuichi Kamiyama , Hidemitsu Asano , Hiroshi Sakai , Hiromu Maie , Yoshihiko Takahashi , Masanori Arai , Ken Motohashi
Abstract: A surface texture measuring apparatus includes an X axis displacement mechanism and a Y axis displacement mechanism displacing a measurable object having an interior wall along an XY plane; a measurement sensor measuring a surface texture of the interior wall without contact; a Z axis displacement mechanism displacing the measurement sensor in a Z axis direction orthogonal to the XY plane and bringing the measurement sensor to face the interior wall; a W axis displacement mechanism displacing the measurement sensor facing the interior wall in a normal direction of the interior wall; and a θ axis displacement mechanism displacing the measurement sensor facing the interior wall along the interior wall.