公开(公告)号：US11880291B2

公开(公告)日：2024-01-23

申请号：US17354690

申请日：2021-06-22

Applicant: Micron Technology, Inc.

Inventor： Todd Jackson Plum ,  Scott D. Van De Graaff ,  Scott E. Schaefer ,  Aaron P Boehm ,  Mark D. Ingram

IPC: G06F11/00 ,  G06F11/30 ,  G06F11/14 ,  G06F11/07

CPC classification number: G06F11/3037 ,  G06F11/0772 ,  G06F11/1417 ,  G06F11/3075

Abstract: Methods, systems, and devices for monitoring and reporting a status of a memory device are described. A memory device may include monitoring circuitry that may be configured to monitor health and wear information for the memory device. A host device may write to a dedicated register of the memory device, to configure the memory device with health status information reporting parameters. The memory device may monitor and report the health status information of the memory device based on the received reporting configuration or based on a default configuration, and may write one or more values indicative of the health status information to a dedicated register. The host device may perform a read on the readout register to obtain the health status information, as indicated by the one or more values, and may adjust operating procedures or take other actions based on the received health status information.