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公开(公告)号：US12189974B2
公开(公告)日：2025-01-07
申请号：US17345267
申请日：2021-06-11
Applicant: Micron Technology, Inc.
Inventor： Aaron P. Boehm , Todd J. Plum , Scott D. Van De Graaff , Scott E. Schaefer , Mark D. Ingram
Abstract: Methods, systems, and devices for operational monitoring for memory devices are described. Some memory devices may degrade over time, and this degradation may include or refer to a reduction of an ability of the memory device to reliably store, read, process, or communicate information, among other degradation. In accordance with examples as disclosed herein, a memory device may include components configured for monitoring health or life expectancy or both of the memory device, such as components internal to the memory device that identify and store various indications of a duration of operating a memory device. An operational duration stored at the memory device may be used in various operations, such as calculations or comparisons, to evaluate health or life expectancy of the memory device, which may include or be supported by various signaling with a host device.
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公开(公告)号：US11977772B2
公开(公告)日：2024-05-07
申请号：US17464333
申请日：2021-09-01
Applicant: Micron Technology, Inc.
Inventor： Aaron P. Boehm , Todd Jackson Plum , Scott D. Van De Graaff , Scott E. Schaefer , Mark D. Ingram
IPC: G06F3/06
CPC classification number: G06F3/0659 , G06F3/0604 , G06F3/0653 , G06F3/0679
Abstract: Methods, systems, and devices for temperature monitoring for memory devices are described for monitoring one or more temperature ranges experienced by a memory device. The memory device may include monitoring circuitry or logic that may identify one or more durations of operating the memory device within the one or more temperature ranges. The memory device may store an indication of the one or more durations, or an indication of information associated with the one or more durations. The indication may be accessed a host device associated with the memory device or may be transmitted by the memory device to the host device. The host device may use information included in the indication to perform an operation associated with the memory device.
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公开(公告)号：US11880291B2
公开(公告)日：2024-01-23
申请号：US17354690
申请日：2021-06-22
Applicant: Micron Technology, Inc.
Inventor： Todd Jackson Plum , Scott D. Van De Graaff , Scott E. Schaefer , Aaron P Boehm , Mark D. Ingram
CPC classification number: G06F11/3037 , G06F11/0772 , G06F11/1417 , G06F11/3075
Abstract: Methods, systems, and devices for monitoring and reporting a status of a memory device are described. A memory device may include monitoring circuitry that may be configured to monitor health and wear information for the memory device. A host device may write to a dedicated register of the memory device, to configure the memory device with health status information reporting parameters. The memory device may monitor and report the health status information of the memory device based on the received reporting configuration or based on a default configuration, and may write one or more values indicative of the health status information to a dedicated register. The host device may perform a read on the readout register to obtain the health status information, as indicated by the one or more values, and may adjust operating procedures or take other actions based on the received health status information.
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公开(公告)号：US11580214B2
公开(公告)日：2023-02-14
申请号：US16552302
申请日：2019-08-27
Applicant: Micron Technology, Inc.
Inventor： Diana C. Majerus , Scott D. Van De Graaff , Todd J. Plum
Abstract: Apparatuses and methods related to logging failed authentication attempts. Failed authentication attempts can be logged in the circuitry by degrading the circuitry. The degradation can signal a fail authentication attempt while an amount of the degradation can represent a timing of the error.
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公开(公告)号：US11561891B1
公开(公告)日：2023-01-24
申请号：US17500751
申请日：2021-10-13
Applicant: Micron Technology, Inc.
Inventor： Aaron P. Boehm , Todd Jackson Plum , Mark D. Ingram , Scott E. Schaefer , Scott D. Van De Graaff
Abstract: Methods, systems, and devices for adaptive user defined health indications are described. A host device may be configured to dynamically indicate adaptive health flags for monitoring health and wear information for a memory device. The host device may indicate, to a memory device, a first index. The first index may correspond to a first level of wear of a set of multiple indexed levels of wear for the memory device. The memory device may determine that a metric of the memory device satisfies the first level of wear and indicate, to the host device, that the first level of wear is satisfied. The host device may receive the indication that the first level of wear is satisfied and indicate, to the memory device, a second level of wear of the set of indexed levels of wear that is different than the first level of wear.
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Patent Agency Ranking
公开(公告)号：US11320479B2
公开(公告)日：2022-05-03
申请号：US16138900
申请日：2018-09-21
Applicant: Micron Technology, Inc.
Inventor： Todd J. Plum , Scott D. Van De Graaff
IPC: G01R31/28 , G11C11/401
Abstract: An electronic device includes: a detection circuit configured to determine one or more operating data, one or more device sensor data, or a combination thereof associated with operation of the electronic device; a trigger circuit operably coupled to the circuit, the trigger circuit configured to generate a stress input based on detecting one or more target criteria from the one or more operating data, the one or more device sensor data, or a combination thereof; and a degradation sensor operably coupled to the trigger circuit, the degradation sensor having a threshold voltage and being configured to record the target criteria that occurs during operation of the electronic device, wherein the degradation sensor is configured to record the target criteria based on degradation of the threshold voltage according to the stress input.
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公开(公告)号：US20250157514A1
公开(公告)日：2025-05-15
申请号：US18954321
申请日：2024-11-20
Applicant: Micron Technology, Inc.
Inventor： Aaron P. Boehm , Scott E. Schaefer , Scott D. Van De Graaff , Mark D. Ingram , Todd Jackson Plum
Abstract: Methods, systems, and devices for memory traffic monitoring are described. The monitoring may include traffic monitoring of access operations performed at various components of the memory device, or may include sensors that may measure parameters of components of the memory device to detect wear. The traffic monitoring or the parameters measured by the sensors may be represented by a characteristic related to an operational bias of circuits of the memory device. The memory device may use the characteristic (e.g., along with a threshold) to determine whether to adjust a parameter associated with performing access operations received by the memory device, in order to implement a corrective action.
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公开(公告)号：US12299325B2
公开(公告)日：2025-05-13
申请号：US17464334
申请日：2021-09-01
Applicant: Micron Technology, Inc.
Inventor： Aaron P. Boehm , Todd Jackson Plum , Scott D. Van De Graaff , Scott E. Schaefer , Mark D. Ingram
IPC: G06F3/06
Abstract: Methods, systems, and devices for operating frequency monitoring for memory devices are described for monitoring one or more operating frequency ranges experienced by a memory device. The memory device may include monitoring circuitry or logic that may identify one or more durations of operating the memory device within the one or more operating frequency ranges. The memory device may store an indication of the one or more durations, or an indication of information associated with the one or more durations. The indication may be accessed a host device associated with the memory device or may be transmitted by the memory device to the host device. The host device may use information included in the indication to perform an operation associated with the memory device.
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公开(公告)号：US11947806B2
公开(公告)日：2024-04-02
申请号：US17505028
申请日：2021-10-19
Applicant: Micron Technology, Inc.
Inventor： Scott E. Schaefer , Aaron P. Boehm , Scott D. Van De Graaff , Todd J. Plum , Mark D. Ingram
CPC classification number: G06F3/0616 , G06F3/0655 , G06F3/0679
Abstract: Methods, systems, and devices for life expectancy monitoring for memory devices are described. A memory device may monitor a parameter of a component of the memory device or the memory device overall, and may determine whether the parameter satisfies a threshold. The parameter may represent or be associated with a lifetime of the component, a level of wear of the component, or an operating parameter violation of the component, or any combination thereof. The memory device may communicate, to a host device, an indication of the parameter satisfying the threshold, and the host device may use the information in the indication to adjust one or more parameters associated with operating the memory device, among other example operations.
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公开(公告)号：US11842080B2
公开(公告)日：2023-12-12
申请号：US17724216
申请日：2022-04-19
Applicant: Micron Technology, Inc.
Inventor： Aaron P. Boehm , Mark D. Ingram , Scott E. Schaefer , Scott D. Van De Graaff , Todd Jackson Plum
CPC classification number: G06F3/0659 , G06F3/0604 , G06F3/0679 , G06F11/3058 , G06F11/3065
Abstract: Methods, systems, and devices for memory device health evaluation at a host device are described. The health evaluation relates to a host device that is associated with a memory device that monitors and reports health information, such as one or more parameters associated with a status of the memory device. The memory device may transmit the health information to the host device, which may perform one or more operations and may transmit the health information to a device of another entity of a system (e.g., ecosystem) including the host device. The host device may include one or more circuits for transmitting and processing the health information, such as a system health engine, a safety engine, a communication component, or a combination thereof. Based on a determination by the host device or information received from an external device, the host device may transmit a command to the memory device.
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