公开(公告)号：US20220293182A1

公开(公告)日：2022-09-15

申请号：US17832117

申请日：2022-06-03

Applicant: Micron Technology, Inc.

Inventor： Huanyou Zhan ,  Massimo Rossini ,  Jun Xu

IPC: G11C16/08 ,  G11C16/04 ,  G01R19/25 ,  G11C16/10 ,  G11C16/26

Abstract: Described are systems and methods for estimating the resistance-capacitance time constant of an electrical circuit (e.g., of a wordline of a memory device). An example system comprises: a memory device comprising a plurality of memory cells electrically coupled to a plurality of wordlines; a resistance-capacitance (RC) measurement circuit to measure a voltage at a specified wordline of the plurality of wordlines; and a processing device coupled to the memory device. The processing device is configured to: apply an initial voltage to a selected wordline of the plurality of wordlines; discharge the selected wordline for a discharge period of time; float the selected wordline until a voltage at the selected wordline is stabilized; determine, by the RC measurement circuit, a stabilized voltage at the selected wordline; and estimate, based on the stabilized voltage, an RC time constant of the wordline.

公开(公告)号：US11615846B2

公开(公告)日：2023-03-28

申请号：US17832117

申请日：2022-06-03

Applicant: Micron Technology, Inc.

Inventor： Huanyou Zhan ,  Massimo Rossini ,  Jun Xu

IPC: G11C16/10 ,  G11C16/08 ,  G11C16/04 ,  G01R19/25 ,  G11C16/26

Abstract: Described are systems and methods for estimating the resistance-capacitance time constant of an electrical circuit (e.g., of a wordline of a memory device). An example system comprises: a memory device comprising a plurality of memory cells electrically coupled to a plurality of wordlines; a resistance-capacitance (RC) measurement circuit to measure a voltage at a specified wordline of the plurality of wordlines; and a processing device coupled to the memory device. The processing device is configured to: apply an initial voltage to a selected wordline of the plurality of wordlines; discharge the selected wordline for a discharge period of time; float the selected wordline until a voltage at the selected wordline is stabilized; determine, by the RC measurement circuit, a stabilized voltage at the selected wordline; and estimate, based on the stabilized voltage, an RC time constant of the wordline.